Abstract: Electronic devices operate in an analog world and their circuitry is subject to non-linear environmental effects that can cause operational problems. Selecting components for a design for a capacitor-charging circuit that incorporates a current-limiting resistor and uses non-linear power supplies, either means having to test every possible combination of elements, and suffering a resultant ‘combinatorial explosion’ as complexity increases, or choosing to over-engineer against untested surprise failure points. Doing the latter in a cost-efficient manner through a min/max/log-set testing series also enables use of non-linear power supplies whose parameters are not known due to competitive or trade secret protective efforts by their manufacturers.

Abstract: Electronic devices operate in an analog world and their circuitry is subject to non-linear environmental effects that can cause operational problems. Selecting components for a design for a capacitor-charging circuit that incorporates a current-limiting resistor and uses non-linear power supplies, either means having to test every possible combination of elements, and suffering a resultant ‘combinatorial explosion’ as complexity increases, or choosing to over-engineer against untested surprise failure points. Doing the latter in a cost-efficient manner through a min/max/log-set testing series also enables use of non-linear power supplies whose parameters are not known due to competitive or trade secret protective efforts by their manufacturers.