Abstract: A verification unit resembling certain aspects of an electronic package is used for testing the proper calibration of lead inspection systems. Comparison of readings provided by the system when the unit is inspected to actual values will indicate whether the system is properly calibrated.

Abstract: An apparatus for loading devices into a semiconductor tester is disclosed. The tester has an input track for accepting devices. The apparatus includes a number of elongated tracks for holding a plurality of semiconductor devices. Each elongated track has at its input end a stop hinge for connection to a tube for holding the semiconductor devices. Each elongated track has at its output end a gate for controlling the release of devices onto the input track of the tester from the elongated track. A control circuit controls the operation of the gates so that the devices can be loaded from the elongated tracks onto the input track of the tester sequentially.