Patents by Inventor Lawrence J. Zagorsky

Lawrence J. Zagorsky has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8410466
    Abstract: A system and method for measuring the physical characteristics of a component where the system includes an electromagnetic radiation source defining a source optical path, the electromagnetic radiation source being operable to cause electromagnetic radiation to propagate along the source optical path, a sensing device defining a sensor optical path, a system support structure, a base structure, an electromagnetic radiation source mounting structure and a sensing device mounting structure, a positioning device including a positioning device stage, wherein the positioning device stage is movably disposed and a retention mount disposed on the positioning device stage, the retention mount being disposed within the sensor optical path such that when a component is retained within the retention mount, the component blocks at least a portion of the electromagnetic radiation to generate a silhouette, wherein the sensing device generates data responsive to the silhouette.
    Type: Grant
    Filed: April 7, 2010
    Date of Patent: April 2, 2013
    Assignee: Quest Metrology Group, LLC
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Publication number: 20120305815
    Abstract: In some embodiments, an inspection system includes a movable collimated light source, a sensing device, a positioning device and a retention mount. The movable collimated light source defines a source optical path and is capable of causing a collimated light beam to propagate along the source optical path. The sensing device defines a sensor optical path. The positioning device includes a positioning device stage that is movably disposed relative to the positioning device, sensing device and movable collimated light source. The retention mount is non-movably disposed on the positioning device stage and disposed within the sensor optical path such that when an item is retained within the retention mount, the item blocks at least a portion of the collimated light beam.
    Type: Application
    Filed: September 23, 2011
    Publication date: December 6, 2012
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Patent number: 8039827
    Abstract: In some embodiments, an inspection system includes a collimated light source defining a source optical path and useful to cause a collimated light beam to propagate along the source optical path and a sensing device defining a sensor optical path. A positioning device includes a positioning device stage movably disposed relative to the positioning device, sensing device and collimated light source. A retention mount is disposed on the positioning device stage and within the sensor optical path such that when an object is retained within the retention mount, the object blocks at least a portion of the collimated light beam.
    Type: Grant
    Filed: March 13, 2010
    Date of Patent: October 18, 2011
    Assignee: Quest Metrology, LLC
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Patent number: 8035094
    Abstract: A method for measuring the physical characteristics of a component includes associating a component with the system such that the component is positioned within the retention mount and operating the system to cause the light source to emit a collimated light beam along a source optical path, where the collimated light beam is reflected to cause a reflected collimated light beam to propagate along a sensor optical path to be incident upon the component to produce a component silhouette where the sensing device generates data responsive to the silhouette. The image data is processed to generate resultant data responsive to the component, wherein the resultant data is further responsive to at least one of a smoothing algorithm, a functional size algorithm and a centering algorithm.
    Type: Grant
    Filed: March 20, 2009
    Date of Patent: October 11, 2011
    Assignee: Quest Metrology, LLC
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Publication number: 20100270484
    Abstract: A system and method for measuring the physical characteristics of a component where the system includes an electromagnetic radiation source defining a source optical path, the electromagnetic radiation source being operable to cause electromagnetic radiation to propagate along the source optical path, a sensing device defining a sensor optical path, a system support structure, a base structure, an electromagnetic radiation source mounting structure and a sensing device mounting structure, a positioning device including a positioning device stage, wherein the positioning device stage is movably disposed and a retention mount disposed on the positioning device stage, the retention mount being disposed within the sensor optical path such that when a component is retained within the retention mount, the component blocks at least a portion of the electromagnetic radiation to generate a silhouette, wherein the sensing device generates data responsive to the silhouette.
    Type: Application
    Filed: April 7, 2010
    Publication date: October 28, 2010
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Publication number: 20100259764
    Abstract: An inspection system and a method for measuring physical characteristics of a component using the inspection system is provided, wherein the inspection system includes a light source, a sensing device and a retention mount, at least one of which is movably associated with the inspection system. The method includes associating a component with the inspection system such that the component is disposed within the retention mount, operating the inspection system to cause the light source to emit a collimated light beam propagating along a source optical path such that the collimated light beam is incident upon the component to produce a component silhouette which is incident upon the sensing device, generating image data responsive to the component silhouette and processing the image data to generate resultant data including at least one of a plurality of physical characteristics of the component.
    Type: Application
    Filed: March 23, 2010
    Publication date: October 14, 2010
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Publication number: 20100245845
    Abstract: A system and method for measuring the physical characteristics of an object is provided, wherein the method includes disposing the object within the sensor optical path of an inspection system, causing a source collimated light beam to propagate along the source optical path to be at least partially incident upon the reflecting device, reflecting the source collimated light beam to create a reflected collimated light beam that propagates along the sensor optical path such that the reflected collimated light beam is at least partially incident upon the object to produce a silhouette, wherein at least a portion of the silhouette is incident upon the sensing device to generate initial image data responsive to the silhouette and processing the initial image data responsive to at least one predetermined algorithm to generate resultant image data responsive to at least one of a plurality of physical characteristics of the object.
    Type: Application
    Filed: March 13, 2010
    Publication date: September 30, 2010
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Patent number: 7777209
    Abstract: An inspection system and a method for measuring physical characteristics of a component using the inspection system is provided, wherein the inspection system includes a light source, a sensing device, a reflecting device, and a retention mount, at least one of which is movably associated with the inspection system. The method includes associating a component with the inspection system, operating the inspection system to cause the light source to emit a collimated light beam propagating along a source optical path, reflecting the collimated light beam via the reflecting device to cause a reflected collimated light beam to be incident upon the component to produce a component silhouette which is incident upon the sensing device, generating image data responsive to the component silhouette and processing the image data to generate resultant data comprising at least one of a plurality of physical characteristics of the component.
    Type: Grant
    Filed: August 12, 2006
    Date of Patent: August 17, 2010
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky
  • Patent number: 7745805
    Abstract: A system and method for measuring the physical characteristics of an object is provided, wherein the method includes disposing the object within the sensor optical path of an inspection system, causing a source collimated light beam to propagate along the source optical path to be at least partially incident upon the reflecting device, reflecting the source collimated light beam to create a reflected collimated light beam that propagates along the sensor optical path such that the reflected collimated light beam is at least partially incident upon the object to produce a silhouette, wherein at least a portion of the silhouette is incident upon the sensing device to generate initial image data responsive to the silhouette and processing the initial image data responsive to at least one predetermined algorithm to generate resultant image data responsive to at least one of a plurality of physical characteristics of the object.
    Type: Grant
    Filed: March 27, 2006
    Date of Patent: June 29, 2010
    Assignee: Johnson Thread-View Systems
    Inventors: Stanley P. Johnson, Lawrence J. Zagorsky