Patents by Inventor Lawrence Lenihan

Lawrence Lenihan has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Garment pattern engineering utilizing two-dimensional imagary of the human form
    Patent number: 9980527
    Abstract: Embodiments of the present invention provide a method, system and computer program product for computer assisted pattern drafting in garment development. In an embodiment of the invention, a pattern making method includes initially acquiring a multiplicity of different two-dimensional image slices of a human form. Thereafter, a panel of a portion of a pattern of a garment is selected for processing in a data processing system and a metric computational rule for the selected panel is mapped to one of the two-dimensional image slices. A measurement of the one of the two-dimensional image slices is then acquired and the mapped metric computational rule is applied using the acquired measurement to produce a measurement for the selected panel.
    Type: Grant
    Filed: May 31, 2016
    Date of Patent: May 29, 2018
    Assignee: RESONANCE COMPANIES LLC
    Inventors: Joseph Ferrara, Lawrence Lenihan
  • GARMENT PATTERN ENGINEERING UTILIZING TWO-DIMENSIONAL IMAGARY OF THE HUMAN FORM
    Publication number: 20170340042
    Abstract: Embodiments of the present invention provide a method, system and computer program product for computer assisted pattern drafting in garment development. In an embodiment of the invention, a pattern making method includes initially acquiring a multiplicity of different two-dimensional image slices of a human form. Thereafter, a panel of a portion of a pattern of a garment is selected for processing in a data processing system and a metric computational rule for the selected panel is mapped to one of the two-dimensional image slices. A measurement of the one of the two-dimensional image slices is then acquired and the mapped metric computational rule is applied using the acquired measurement to produce a measurement for the selected panel.
    Type: Application
    Filed: May 31, 2016
    Publication date: November 30, 2017
    Inventors: Joseph Ferrara, Lawrence Lenihan