Patents by Inventor Lawrence Plonsker

Lawrence Plonsker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9153023
    Abstract: Systems and methods are disclosed which enable more accurate examination of industrial diagnostic images, for example x-ray, ultrasound and terahertz camera images. The systems and methods highlight anomalies that have changed between the collection times of two or more diagnostic images, and can also provide objective scoring of the degree of change.
    Type: Grant
    Filed: July 28, 2014
    Date of Patent: October 6, 2015
    Inventors: Kelce S. Wilson, Susan M. Gaschke, Lawrence Plonsker
  • Publication number: 20140334699
    Abstract: Systems and methods are disclosed which enable more accurate examination of industrial diagnostic images, for example x-ray, ultrasound and terahertz camera images. The systems and methods highlight anomalies that have changed between the collection times of two or more diagnostic images, and can also provide objective scoring of the degree of change.
    Type: Application
    Filed: July 28, 2014
    Publication date: November 13, 2014
    Inventors: Kelce S. Wilson, Susan M. Gaschke, Lawrence Plonsker
  • Patent number: 8792696
    Abstract: Systems and methods are disclosed which enable more accurate examination of industrial diagnostic images, for example x-ray, ultrasound and terahertz camera images. The systems and methods highlight anomalies that have changed between the collection times of two or more diagnostic images, and can also provide objective scoring of the degree of change.
    Type: Grant
    Filed: August 26, 2013
    Date of Patent: July 29, 2014
    Inventors: Kelce S. Wilson, Susan M. Gaschke, Lawrence Plonsker
  • Publication number: 20130343621
    Abstract: Systems and methods are disclosed which enable more accurate examination of industrial diagnostic images, for example x-ray, ultrasound and terahertz camera images. The systems and methods highlight anomalies that have changed between the collection times of two or more diagnostic images, and can also provide objective scoring of the degree of change.
    Type: Application
    Filed: August 26, 2013
    Publication date: December 26, 2013
    Inventors: Kelce S. Wilson, Susan M. Gaschke, Lawrence Plonsker