Patents by Inventor Leah M. Pfeifer Pastel

Leah M. Pfeifer Pastel has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Iterative process for identifying systematics in data
    Patent number: 7596736
    Abstract: An iterative process for identifying systematics in data is provided. In general, a set of data is processed based on a signature definition to create a set of signature data. The set of signature data is then analyzed to identify common signatures. The set of signature data is modified, using knowledge of the common signature(s), creating a revised set of signature data. The revised set of signature data is then analyzed again to identify new common signatures, if any. The modifying and analyzing steps are repeated until no new common signatures are identified. When no new common signatures are identified, the identified common signatures are reported.
    Type: Grant
    Filed: March 24, 2006
    Date of Patent: September 29, 2009
    Assignee: International Business Machines Corporation
    Inventors: Maroun Kassab, Leah M. Pfeifer Pastel
  • Learning based logic diagnosis
    Patent number: 7558999
    Abstract: A system and method for diagnosing a failure in an electronic device. A disclosed system comprises: a defect table that associates previously studied features with known failures; and a fault isolation system that compares an inputted set of suspected faulty device features with the previously studied features listed in the defect table in order to identify causes of the failure.
    Type: Grant
    Filed: May 21, 2004
    Date of Patent: July 7, 2009
    Assignee: International Business Machines Corporation
    Inventors: James W. Adkisson, John M. Cohn, Leendert M. Huisman, Maroun Kassab, Leah M. Pfeifer Pastel, David E. Sweenor
  • Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
    Patent number: 7434130
    Abstract: In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.
    Type: Grant
    Filed: December 7, 2004
    Date of Patent: October 7, 2008
    Assignee: International Business Machines Corporation
    Inventors: Leendert M. Huisman, William V. Huott, Franco Motika, Leah M. Pfeifer Pastel
  • Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
    Patent number: 6865501
    Abstract: In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.
    Type: Grant
    Filed: October 30, 2003
    Date of Patent: March 8, 2005
    Assignee: International Business Machines Corporation
    Inventors: Leendert M. Huisman, William V. Huott, Franco Motika, Leah M. Pfeifer Pastel
  • Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
    Publication number: 20040093185
    Abstract: In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.
    Type: Application
    Filed: October 30, 2003
    Publication date: May 13, 2004
    Applicant: International Business Machines Corporation
    Inventors: Leendert M. Huisman, William V. Huott, Franco Motika, Leah M. Pfeifer Pastel
  • Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
    Patent number: 6671644
    Abstract: In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.
    Type: Grant
    Filed: August 15, 2001
    Date of Patent: December 30, 2003
    Assignee: International Business Machines Corporation
    Inventors: Leendert M. Huisman, William V. Huott, Franco Motika, Leah M. Pfeifer Pastel
  • Using clock gating or signal gating to partition a device for fault isolation and diagnostic data collection
    Publication number: 20030036869
    Abstract: In one aspect, an electronic device that has been partitioned into segments by using clock gating or signal gating is tested. One of the segments that is a source of a failure is identified. Diagnostic procedures are applied to the identified segment to determine a cause of the failure.
    Type: Application
    Filed: August 15, 2001
    Publication date: February 20, 2003
    Applicant: International Business Machines Corporation
    Inventors: Leendert M. Huisman, William V. Huott, Franco Motika, Leah M. Pfeifer Pastel