Abstract: Disclosed are example systems and methods for power management. In particular, described are example systems and methods that may be used to provide different power modes. For example, different sub-systems that consume different amounts of power may be used in the system. In some embodiments, one of the sub-systems may always be active (i.e., always on (AON)) when the system is powered on, and another of the sub-systems may be switched between being active and being inactive (i.e., powered on and off (ONO)) depending on power mode. In some embodiments, the systems and methods disclosed herein may prevent data sent from an ONO sub-system from being stored in an AON sub-system until the ONO sub-system determines it has been properly reset. In some embodiments, the systems and methods disclosed herein may isolate an AON sub-system from signals sent from an ONO sub-system prior to powering down the ONO sub-system.

Abstract: Rapid-data-transfer sensor arrays include a controller and a plurality of sensor integrated circuits (ICs) connected in series and configured to periodically take measurements and provide measurement data to the controller as serial data. The sensor IC includes a power regulation circuit configured to selectively supply power for a low-power mode and an active mode for recording data and an internal shift register. When finished with the measurement, the sensor IC is configured to provide measurement data to the shift register for transfer to the controller. The controller is configured to initiate serial transfer of data from each of the shift registers of the first plurality of sensor ICs to the controller. Switching functionality provides the capability to switch sensors or sensor ICs from one operational mode to another, e.g., from a rapid serial data out (RDSO) mode to an SPI mode.

Abstract: Rapid-data-transfer sensor arrays include a controller and a plurality of sensor integrated circuits (ICs) connected in series and configured to periodically take measurements and provide measurement data to the controller as serial data. The sensor IC includes a power regulation circuit configured to selectively supply power for a low-power mode and an active mode for recording data and an internal shift register. When finished with the measurement, the sensor IC is configured to provide measurement data to the shift register for transfer to the controller. The controller is configured to initiate serial transfer of data from each of the shift registers of the first plurality of sensor ICs to the controller. Switching functionality provides the capability to switch sensors or sensor ICs from one operational mode to another, e.g., from a rapid serial data out (RDSO) mode to an SPI mode.

Abstract: An angle sensor comprising: a plurality of magnetic field sensing elements configured to detect a magnetic field and generate a respective plurality of analog magnetic field signals; a plurality of analog frontend circuits each analog frontend circuit associated with a respective magnetic field sensing element; and a digital feedback circuit configured to generate digital magnetic field signals from the plurality of analog magnetic field signals and generate digital error correction values, wherein the plurality of analog frontend circuits are configured to obtain the digital error correction values from the digital feedback circuit, generate analog correction values from the digital error correction values, and apply the analog correction values to the plurality of analog magnetic field signals to generate a plurality of corrected analog magnetic field signals.

Abstract: A method for use in a sensor includes generating a first signal by a first sensing module in response to a magnetic field associated with a rotating target, generating a base word based on the first signal, the base word including a first base bit that is generated by comparing respective components of the first signal, reversing a respective polarity of the first signal and offsetting the first signal, generating a test word based on the first signal, the test word being generated after the respective polarity of the first signal is reversed and the first signal is offset, the test word including a first test bit that is generated by comparing the respective components of the first signal, and setting a value of an error signal based on whether the test word matches the base word.

Abstract: A method for use in a sensor includes generating a first signal by a first sensing module in response to a magnetic field associated with a rotating target, generating a base word based on the first signal, the base word including a first base bit that is generated by comparing respective components of the first signal, reversing a respective polarity of the first signal and offsetting the first signal, generating a test word based on the first signal, the test word being generated after the respective polarity of the first signal is reversed and the first signal is offset, the test word including a first test bit that is generated by comparing the respective components of the first signal, and setting a value of an error signal based on whether the test word matches the base word.

Abstract: An angle sensor comprising: a plurality of magnetic field sensing elements configured to detect a magnetic field and generate a respective plurality of analog magnetic field signals; a plurality of analog frontend circuits each analog frontend circuit associated with a respective magnetic field sensing element; and a digital feedback circuit configured to generate digital magnetic field signals from the plurality of analog magnetic field signals and generate digital error correction values, wherein the plurality of analog frontend circuits are configured to obtain the digital error correction values from the digital feedback circuit, generate analog correction values from the digital error correction values, and apply the analog correction values to the plurality of analog magnetic field signals to generate a plurality of corrected analog magnetic field signals.

Abstract: In one aspect, an integrated circuit (IC) includes a multiplexor configured to receive data from a non-volatile memory and configured to receive data from a shadow memory, a shift register configured to generate a first signature from the data received from the non-volatile memory and configured to generate a second signature from the data received from the shadow memory; a signature storage configured to store the first signature; and a shadow memory checking controller configured to enable the multiplexor to send the data from the non-volatile memory to the shift register, and send a command to reload the shadow memory with data from the non-volatile memory in response to receiving an error flag. The IC also includes a comparator circuit configured to compare the first signature and the second signature and configured to send the error flag in response to the first signature and the second signature being different.

Abstract: In one aspect, an integrated circuit (IC) includes a multiplexor configured to receive data from a non-volatile memory and configured to receive data from a shadow memory, a shift register configured to generate a first signature from the data received from the non-volatile memory and configured to generate a second signature from the data received from the shadow memory; a signature storage configured to store the first signature; and a shadow memory checking controller configured to enable the multiplexor to send the data from the non-volatile memory to the shift register, and send a command to reload the shadow memory with data from the non-volatile memory in response to receiving an error flag. The IC also includes a comparator circuit configured to compare the first signature and the second signature and configured to send the error flag in response to the first signature and the second signature being different.