Abstract: Embodiments herein describe techniques for binning integrated circuits (ICs) using an adaptive binning system that can re-bin the ICs in response to receiving a new or updated test specification. Unlike static binning systems, in one embodiment, the binning system receives measured test data from a testing system. Put differently, instead of a testing apparatus simply indicating whether an IC does (or does not) satisfy the criteria in the test specification, the testing apparatus provides measured test data to the binning system. The binning apparatus can then store the received test data. As such, if a new test specification is received or generated, the binning system can use the already saved test data to re-bin the ICs using the criteria in the new test specification without having to re-test the ICs. In this manner, the binning system can re-categorize the ICs as customer needs or customer demand changes.

Abstract: In one embodiment, a configuration data sequence is input to a master programmable integrated circuit (IC). In response to control bits in the configuration data sequence, the master programmable IC transmits the configuration data sequence to one or more slave programmable ICs. The master programmable IC and the one or more slave programmable ICs are configured in parallel with configuration bits from the configuration data sequence.