Patents by Inventor Lee Ni Chung

Lee Ni Chung has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8030954
    Abstract: Operation of an internal voltage supply level (Vgg) of an IC is characterized over operating temperature or at a selected temperature to determine a temperature-equivalent internal voltage level. The internal voltage supply of the IC is set to the temperature-equivalent level, and the IC is tested at room temperature to screen for low-temperature defects or high-temperature defects.
    Type: Grant
    Filed: January 14, 2009
    Date of Patent: October 4, 2011
    Assignee: Xilinx, Inc.
    Inventors: Srinivasa R. Parthasarathy, Lee Ni Chung, Jian Jun Shi, Randy J. Simmons
  • Patent number: 7302625
    Abstract: A Built-in Self Test (BIST) system is provided in a Field Programmable Gate Array (FPGA) that can adjust test signal patterns provided for testing after partial reconfiguration of the FPGA. The BIST system includes a decoder that monitors I/O signals and provides an output indicating when I/O signals change indicating partial reconfiguration has occurred. The decoder output is provided to a BIST test signal generator providing signals to an IP core of the FPGA as well as a BIST comparator for monitoring test results to change test signals depending on the partial configuration mode.
    Type: Grant
    Filed: November 21, 2005
    Date of Patent: November 27, 2007
    Assignee: Xilinx, Inc.
    Inventors: Tassanee Payakapan, Lee Ni Chung, Shahin Toutounchi