Abstract: A transistor may include a semiconductor layer having a source region, a drain region, and a channel region between the source region and the drain region. The channel region may have a source interface and a drain interface, and may be bounded by edges extending from the source interface to the drain interface on two boundaries between a field-sensitive semiconductor material and an isolation material. The transistor may further include an insulator layer on the channel region. The transistor may further include a gate on the insulator layer. The gate may have extensions beyond edges of the channel region. The extensions may substantially exceed a minimum specified value.

Abstract: A transistor may include a semiconductor layer having a source region, a drain region, and a channel region between the source region and the drain region. The channel region may have a source interface and a drain interface, and may be bounded by edges extending from the source interface to the drain interface on two boundaries between a field-sensitive semiconductor material and an isolation material. The transistor may further include an insulator layer on the channel region. The transistor may further include a gate on the insulator layer. The gate may have extensions beyond edges of the channel region. The extensions may substantially exceed a minimum specified value.