Patents by Inventor Leela Ganguly

Leela Ganguly has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for additive adhesion force particle analysis and apparatus thereof
    Patent number: 6598466
    Abstract: A method including: sonicating a liquid suspension of first particles; and analyzing the liquid phase for second particles. An apparatus including: a sonicator adapted to sonicate a liquid suspension of first particles; and a first analyzer adapted to analyze the sonicated liquid phase for second particles. The method and apparatus can be used to analyze the adhesion force relationships between the main or host first particles and guest or surface additive second particles.
    Type: Grant
    Filed: October 5, 2000
    Date of Patent: July 29, 2003
    Assignee: Xerox Corporation
    Inventors: Allen F. Deluca, Timothy L. Lincoln, Hon H. Le, Christine L. Demay, Eric Murray, David A. Allen, Leela Ganguly
  • Method for additive adhesion force particle analysis and apparatus thereof
    Patent number: 6508104
    Abstract: A method including: sonicating a liquid suspension of first particles; and analyzing the liquid phase for second particles. An apparatus including: a sonicator adapted to sonicate a liquid suspension of first particles; and a first analyzer adapted to analyze the sonicated liquid phase for second particles. The method and apparatus can be used to analyze the adhesion force relationships between the main or host first particles and guest or surface additive second particles.
    Type: Grant
    Filed: October 5, 2000
    Date of Patent: January 21, 2003
    Assignee: Xerox Corporation
    Inventors: Allen F. Deluca, Timothy L. Lincoln, Hon H. Le, Christine L. Demay, Eric Murray, David A. Allen, Leela Ganguly
  • Method and apparatus for detecting substrate roughness and controlling print quality
    Patent number: 5689757
    Abstract: A method and apparatus for determining the level of roughness in a paper or other substrate to be processed in a machine, and for correspondingly adjusting the machine parameters that are affected by the different levels of substrate roughness, before the substrate is processed through the machine.
    Type: Grant
    Filed: July 28, 1995
    Date of Patent: November 18, 1997
    Assignee: Xerox Corporation
    Inventors: John L. Ferrante, Leela Ganguly, J. Stephen Kittelberger, Kathryn A. Wallace, Joseph R. Weber