Abstract: A laser microdissection device includes a microscope stage for carrying a specimen to be cut, a laser light source for generating a laser beam and a microscope objective for focusing the laser beam onto the specimen. An optical laser scanning device is configured to deflect the laser beam so as to move the laser beam focus in an X-Y direction perpendicular to a main axis of the microscope objective. The laser microdissection device also includes at least one of a Z displacement device configured to move the microscope stage in a Z direction, or an optical focus shifting device configured to move the focus of the laser beam in the Z direction. The Z displacement device and/or optical focus shifting device are controllable, together with the optical laser scanning device, so as to move the laser beam focus in the specimen along a three-dimensional cut line in an X-Y-Z direction.

Abstract: A microscope objective changer includes a changing device for changing at least two objectives. A movable objective holder corresponds to each objective. Each movable objective holder is configured to receive a respective one of the objectives and to transfer the respective objective along a respective displacement path from an allocated stand-by position into an operating position. A carrier is associated with each objective holder and includes a guide groove constituting the respective displacement path. Each displacement path includes a first portion beginning at the respective stand-by position and extends substantially perpendicular to the optical axis and a second portion directly bordering the first portion that includes a downwardly component in a direction parallel to the optical axis such that each objective holder is movable from the respective stand-by position to the optical axis of the operating position when reaching a lower end of the second portion of the displacement path.

Abstract: A microscope (10) has an aperture arrangement (29) that, in order to limit the dimension of a light beam (41), comprises an aperture opening (37). The size of the aperture opening (37) is adjustable with the aid of a first aperture member (32) and a second aperture member (34). At least one of the two aperture members (32, 34) is movable relative to the other aperture member (32, 34). The aperture members (32, 34) are spaced apart from one another when the aperture opening (37) is closed.

Abstract: A method and an apparatus for examining a sample. The apparatus has a light source for generating excitation light in pulses which occur in succession at an excitation pulse frequency, for illuminating a sample region with the excitation pulse, and having a detector for detecting the detection light emanating from the sample region. The apparatus is characterized in that, for each detected photon of the detection light, the detector generates an electrical pulse and thereby a sequence of electrical pulses, and an analog-digital converter is provided that generates a digital data sequence by sampling the sequence of electrical pulses at a sampling rate.

Abstract: The present invention relates to a microscope illumination system for switching between a first, confocal and a second, non-confocal microscope illumination mode, the system having an illumination unit that, in order to provide the first illumination mode, includes an illumination source for generating an illumination beam propagating parallel to the optical axis; a scanning mirror for deflecting the illumination beam perpendicular to the optical axis; and a scanning eyepiece and a downstream scanning tube lens for imaging the scanning mirror into the back focal plane of a microscope objective and for expanding the illumination beam, the objective focusing the illumination beam onto a specimen to be examined. In order to provide the second illumination mode, the system has a focusing lens inserted into the path of the illumination beam in such a way that the illumination beam is focused into the back focal plane of the microscope objective.

Abstract: The present invention relates to a method for measuring the lifetime of an excited state in a sample, in particular a fluorescence lifetime, and to an apparatus for carrying out such a method. First, an excitation pulse is generated and a sample region is illuminated with the excitation pulse. Then, a first digital data sequence is generated which is representative of the power-time profile of the excitation pulse, and a first switching instant is determined from the first digital data sequence. Moreover, the detection light emanating from the sample region is detected by a detector, and a second digital data sequence is generated which is representative of the power-time profile of the detection light, and a second switching instant is determined from the second digital data sequence. Finally, the time difference between the first and second switching instants is calculated.

Abstract: A microscopic device for three-dimensional localization of point-like objects, encompassing a detection optical system that images point-like objects, each in the form of a three-dimensional focus light distribution, into an image space; a color separation apparatus that divides the light into at least two separate light bundles of different wavelength regions; at least two image space detector units , one receiving one light bundle and the other receiving the other light bundle, each detector unit comprising a light-spot-sensing detection surface ; an evaluation unit that ascertains a lateral X-Y position and an axial Z position relative to the sharpness plane in a direction perpendicular to the sharpness plane; at least one Z-position correction value for at least one of the wavelength regions being stored in the evaluation unit, which value indicates a detection optical system longitudinal chromatic aberration in that wavelength region; and the evaluation unit correcting the Z position.

Abstract: A method for illumination and detection in RESOLFT microscopy using a pulsed or continuous light source for excitation light and switching light is characterized in that the excitation light (4) is irradiated in pulses and in that the pulse of the excitation light (4) is longer than 150 picoseconds, preferably up to a few hundred picoseconds, and even up to a few nanoseconds. A corresponding apparatus uses the method according to the present invention.

Abstract: A method for illuminating at least one sample in SPIM microscopy includes generating a light beam and forming a light strip from the light beam using an optical device that interacts with the light beam. The light strip is passed strip through at least one objective having optics configured to deliver detection light emanating from the sample directly or indirectly to a detector, with the objective optics interacting with the light strip. The light strip is deflected using a light-redirecting device downstream of the objective optics so as to propagate the light strip, after deflection, at an angle other than zero degrees with respect to an optical axis of the objective in order to illuminate the sample.

Abstract: Illuminating arrangement for a microscope (200) having a first LED (10) for providing light with a first intensity spectrum (K1) with at least two intensity maxima and an intensity minimum located between the intensity maxima, and at least one further LED (20) for providing light with a further intensity spectrum (K2) respectively, each further intensity spectrum (K2) having an intensity maximum in the region of the intensity minimum of the first intensity spectrum (K1), and a device (30) for merging the light of the first LED (10) and the light of the at least one further LED (20), by means of which illuminating light can be produced with a combined intensity spectrum (K3) composed of light with the first intensity spectrum and light with each of the further intensity spectra.

Abstract: A method and apparatus provide identification of a spherical error of a microscope imaging beam path in a context of microscopic imaging of a sample using a microscope having an objective. A coverslip that carries or covers the sample is arranged in the imaging beam path. A measurement beam is guided through the objective onto the sample in a decentered fashion that is outside an optical axis of the objective. The measurement beam is reflected at an interface of the coverslip with the sample and the reflected measurement beam is guided through the objective onto a detector. An intensity profile of the reflected measurement beam is detected with the detector and a presence of a spherical error from the intensity profile is determined qualitatively and/or quantitatively.

Abstract: In order to investigate a specimen (30) with the aid of a microscope (20), dye particles (40, 42) in the specimen (30) are excited to fluoresce with the aid of a first illumination light beam (24). Fluorescent light proceeding from the specimen (30) is directed via an optical arrangement (34) onto an areal sensor (36), the optical arrangement (34) acting on the fluorescent light in such a way that sub-beams of the fluorescent light interfere with themselves, so that interference patterns produced as a result of the interference are imaged on a sensitive surface of the areal sensor (36) and sensed thereby. Positions of the dye particles (40, 42) within the specimen (30) are ascertained as a function of the interference patterns.