Patents by Inventor Leland Nevill

Leland Nevill has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for Isolating a Short-Circuited Integrated Circuit (IC) From Other ICs on a Semiconductor Wafer
    Publication number: 20080111574
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: January 21, 2008
    Publication date: May 15, 2008
    Applicant: MICRON TECHNOLOGY, INC.
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud
  • Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
    Publication number: 20070103167
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: December 1, 2006
    Publication date: May 10, 2007
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud
  • Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
    Publication number: 20070075723
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud
  • Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
    Publication number: 20070075725
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud
  • Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
    Publication number: 20070075722
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: December 1, 2006
    Publication date: April 5, 2007
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud
  • Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
    Publication number: 20060192582
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: April 24, 2006
    Publication date: August 31, 2006
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud
  • Device and method for isolating a short-circuited integrated circuit (IC) from other ICs on a semiconductor wafer
    Publication number: 20050093566
    Abstract: A circuit for isolating a short-circuited integrated circuit (IC) formed on the surface of a semiconductor wafer from other ICs formed on the wafer that are interconnected with the short-circuited IC includes control circuitry within the short-circuited IC for sensing the short circuit. The control circuitry may sense the short circuit in a variety of ways, including sensing excessive current drawn by the short-circuited IC, and sensing an abnormally low or high voltage within the short-circuited IC. Switching circuitry also within the short-circuited IC selectively isolates the short-circuited IC from the other ICs on the wafer in response to the control circuitry sensing the short circuit. As a result, if the wafer is under probe test, for example, testing can continue uninterrupted on the other ICs while the short-circuited IC is isolated.
    Type: Application
    Filed: December 10, 2004
    Publication date: May 5, 2005
    Inventors: Warren Farnworth, William Waller, Leland Nevill, Raymond Beffa, Eugene Cloud