Abstract: An apparatus and a method for measuring deformations and force applied to a probe are disclosed. The system may be a mechanical system a physical system or a biological system such as e.g. a bodily hollow system. The apparatus comprises an elongated elastic probe, a conducting medium attached to or contained by the probe, two or more electrodes being electrically connected by the conducting medium, the electrodes being attached to the probe, and the apparatus furthermore comprising means for measuring an electrical parameter, such as the potential difference between at least two of the number of electrodes, the measured electrical parameter being indicative of a deformation of the probe in at least the longitudinal direction of the elongated probe. The force applied to the probe may be determined from a pre-calibration of the electrical parameter-force relationship of the probe.