Patents by Inventor Leo H. J. F. Beckman

Leo H. J. F. Beckman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Measuring system employing a measuring method based on the triangulation principle for the non-contact measurement of a distance from the surface of a contoured object to a reference level. _
    Patent number: 4701049
    Abstract: An apparatus for dimensional inspection of an object. The apparatus is adapted to produce a slender beam of measuring radiation for irradiating an object under examination. Reflected light image receiving means are provided including a receiving lens for collecting radiation reflected from an object surface spot irradiated by the measuring beam, and a linear photo-sensitive detector. The receiving lens is dimensioned and disposed relative to the measuring beam and the linear detector as to exclusively project those object surface spots irradiated by a longitudinal section defining a measuring range, of the measuring beam, as focussed dots on the linear photo-sensitive detector area. For improving the resolution of the focussed dots produced on the detector, a beam forming lens is provided for causing the cross-sectional area of the measuring beam to gradually increase over the measuring range.
    Type: Grant
    Filed: June 19, 1984
    Date of Patent: October 20, 1987
    Assignee: B.V. Optische Industrie "De Oude Delft"
    Inventors: Leo H. J. F. Beckman, Gysbert L. Oomea