Abstract: A characterization system includes a signal detector. The signal detector includes a first conversion unit configured to receive, from a first device, a first device output signal including N possible discrete pulse amplitudes and generate a plurality of detected signals based on a plurality of threshold amplitudes respectively. The signal detector further includes a second conversion unit configured to generate a first conversion output signal and a second conversion output signal based on logic values included in the plurality of detected signals and provide first and second conversion output signals to an analysis unit for generating one or more measurements of the first device. The first and second conversion output signals include M1 and M2 possible discrete pulse amplitudes respectively. M1 and M2 are integers less than N.

Abstract: A transceiver circuit for self-test of jitter tolerance is disclosed. The transceiver circuit includes a transmitter circuit having an output coupled to an output terminal of the transceiver and a receiver circuit having in input coupled to an input terminal of the transceiver. The transceiver also includes a loopback path configured to provide a signal transmitted by the transmitter circuit to the input of the receiver circuit. The transceiver also includes a test control circuit that causes jitter to be introduced in the signal transmitted by the transmitter circuit when the test control circuit is operating in a self-test mode, but not when the test control circuit is operating in a non-test mode.