Abstract: A method is provided for manufacturing a magneto-resistive device, comprising the steps of: extracting at least one subset of bars from at least one bar section of a wafer; obtaining a magnetic performance of the at least one subset of the bars; determining an angle based on the magnetic performance; and processing remaining bars from the at least one bar section of the wafer based on the determined angle.

Abstract: Systems and methods are provided for manufacturing magneto-resistive devices utilized in magneto-resistive read elements by depositing a plurality of rows of magnetic transducers on a wafer. The wafer may then be diced/cut into bars of active device regions for incorporation into a magnetic recording head. Sampling of a subset of bars from one or more bar sections of the wafer may be processed to obtain feedback associated with magnetic erase width (MEW). An air bearing surface (ABS) tilt angle based on the MEW feedback may then be applied to the one or more bar sections of the water during subsequent processing to optimize the magnetic performance of each resulting magneto-resistive device.