Patents by Inventor Leon Albertus Van De Logt

Leon Albertus Van De Logt has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Electronic circuit and method for testing
    Patent number: 6883129
    Abstract: An integrated circuit is switchable between a normal operating mode and a test mode. A functional circuit and a test pattern converter are both coupled between input contacts, output contacts and a redefinable contact of the integrated circuit. In the test mode respectively the test pattern converter drives the outputs contacts and, dependent on the circuit configuration, the redefinable contact. The test pattern converter is arranged to provide a first and second relation between signals at the input contacts and the output contacts, with the redefinable contact used as an input or output contact respectively, dependent on the circuit configuration. The relations have been selected so as to permit testing of stuck-at and cross-connect errors with the redefinable contact used as input and output contact respectively.
    Type: Grant
    Filed: August 12, 2002
    Date of Patent: April 19, 2005
    Assignee: Koninklijke Philips Electronics N.V.
    Inventors: Alexander Sebastian Biewenga, Leon Albertus Van De Logt, Franciscus Gerardus Maria De Jong, Guillaume Elisabeth Andreas Lousberg
  • Electronic circuit and method for testing
    Publication number: 20030051198
    Abstract: An integrated circuit is switchable between a normal operating mode and a test mode. A functional circuit and a test pattern converter are both coupled between input contacts, output contacts and a redefinable contact of the integrated circuit. In the test mode respectively the test pattern converter drives the outputs contacts and, dependent on the circuit configuration, the redefinable contact. The test pattern converter is arranged to provide a first and second relation between signals at the input contacts and the output contacts, with the redefinable contact used as an input or output contact respectively, dependent on the circuit configuration. The relations have been selected so as to permit testing of stuck-at and cross-connect errors with the redefinable contact used as input and output contact respectively.
    Type: Application
    Filed: August 12, 2002
    Publication date: March 13, 2003
    Inventors: Alexander Sebastian Biewenga, Leon Albertus Van De Logt, Franciscus Gerardus Maria De Jong, Guillaume Elisabeth Andreas Lousberg