Patents by Inventor Leon Robert Zoeller, III
Leon Robert Zoeller, III has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10346962Abstract: A method of examining a cellular structure includes the steps of providing an inspecting device, a neural network and a target cellular structure that includes a plurality of target cells extending therethrough and further includes a target face exposing an arrangement of the target cells; inspecting the arrangement of cells on the face of the target cellular structure using the inspecting device; representing the arrangement of cells with numerically defined target cell parameters; inputting the target cell parameters into the neural network; and generating an output from the neural network based on the target cell parameters, the output being indicative of a strength of the target cellular structure.Type: GrantFiled: February 10, 2012Date of Patent: July 9, 2019Assignee: Corning IncorporatedInventors: Alan Thomas Stephens, II, Leon Robert Zoeller, III
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Patent number: 9360519Abstract: Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.Type: GrantFiled: January 18, 2013Date of Patent: June 7, 2016Assignee: CORNING INCORPORATEDInventors: Robert Addison Boudreau, Douglas Edward Brackley, Kevin Thomas Gahagan, Gary Edward Merz, Leon Robert Zoeller, III
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Publication number: 20150177160Abstract: Non-imaging coherent line scanner systems for measuring at least one defect in a transparent sheet are disclosed. The systems include a laser system that generates coherent diverging laser-line beam, and a cylindrical optical system that forms therefrom a collimated laser-line beam. A movable support member supports and moves the transparent sheet so that the collimated laser-line beam scans the transparent sheet and passes through a portion of the transparent sheet and the at least one defect during scanning. A line-scan sensor system receives the transmitted collimated laser-line beam and a portion of the beam redirected by the defect. The result is an interference image that has at least one coherent defect signature representative of the at least one defect in the transparent object.Type: ApplicationFiled: December 17, 2014Publication date: June 25, 2015Inventor: Leon Robert Zoeller, III
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Publication number: 20130212051Abstract: A method of examining a cellular structure includes the steps of providing an inspecting device, a neural network and a target cellular structure that includes a plurality of target cells extending therethrough and further includes a target face exposing an arrangement of the target cells; inspecting the arrangement of cells on the face of the target cellular structure using the inspecting device; representing the arrangement of cells with numerically defined target cell parameters; inputting the target cell parameters into the neural network; and generating an output from the neural network based on the target cell parameters, the output being indicative of a strength of the target cellular structure.Type: ApplicationFiled: February 10, 2012Publication date: August 15, 2013Inventors: Alan Thomas Stephens, II, Leon Robert Zoeller, III
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Publication number: 20130127487Abstract: Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.Type: ApplicationFiled: January 18, 2013Publication date: May 23, 2013Inventors: Robert Addison Boudreau, Douglas Edward Brackley, Kevin Thomas Gahagan, Gary Edward Merz, Leon Robert Zoeller, III
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Patent number: 8378702Abstract: Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.Type: GrantFiled: May 8, 2009Date of Patent: February 19, 2013Assignee: Corning IncorporatedInventors: Robert Addison Boudreau, Douglas Edward Brackley, Kevin Thomas Gahagan, Gary Edward Merz, Leon Robert Zoeller, III
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Patent number: 8285027Abstract: A high-resolution, large-field scanning inspection system for inspecting extruded ceramic honeycomb structures is disclosed. The system allows for inspecting cells at an endface of a cellular ceramic substrate by capturing, along an optical axis, line images of illuminated cells as a line illumination scans over at least a portion of the plurality of cells. The inspection method includes centering the line illumination on the optical axis to make the line illumination normally incident upon the endface. The inspection method also includes forming from the line images a composite image of the cells, and determining from the composite image at least one parameter of at least one cell.Type: GrantFiled: November 13, 2009Date of Patent: October 9, 2012Assignee: Corning IncorporatedInventor: Leon Robert Zoeller, III
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Patent number: 8049878Abstract: Systems (50) and methods are disclosed for detecting defects (DEF1-DEF5) in a ceramic filter body (10) having a honeycomb structure (12) that defined multiple channels (20). Plugs (30) are used to seal select channel ends (22, 24). The methods include using a first light source unit (52) and a first detector unit (62) operably arranged at respective first and second ends (16, 18) of the honeycomb structure so as to be capable of being in optical communication. Light beams (LB) are transmitted from the first light source unit to the first detector unit through multiple channels. Defects in a given plug allow a detectable portion (LBD) of the corresponding light beam to be detected. Multiple detector elements (64) are used to detect the detectable light beam portion to provide location and intensity variation information, which helps deduce the precise location and nature of the defect.Type: GrantFiled: August 22, 2008Date of Patent: November 1, 2011Assignee: Corning IncorporatedInventor: Leon Robert Zoeller, III
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Publication number: 20110116704Abstract: A high-resolution, large-field scanning inspection system for inspecting extruded ceramic honeycomb structures is disclosed. The system allows for inspecting cells at an endface of a cellular ceramic substrate by capturing, along an optical axis, line images of illuminated cells as a line illumination scans over at least a portion of the plurality of cells. The inspection method includes centering the line illumination on the optical axis to make the line illumination normally incident upon the endface. The inspection method also includes forming from the line images a composite image of the cells, and determining from the composite image at least one parameter of at least one cell.Type: ApplicationFiled: November 13, 2009Publication date: May 19, 2011Inventor: Leon Robert Zoeller, III
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Publication number: 20100283499Abstract: Apparatus and methods for non-contact testing of electronic components printed on a substrate (3) are provided. Test circuits (11) are printed on the substrate (3) at the same time as the desired electronic component. The test circuits (11) are all optical and include a first portion (13) for providing electrical energy for the test circuit (11) and a second portion (15) for generating a detectable optical signal that is indicative of at least one electrical property of the electronic component. The test circuits are used in real time and minimize the production of unusable scrap in the printing of such products as ePaper.Type: ApplicationFiled: May 8, 2009Publication date: November 11, 2010Inventors: Robert Addison Bourdreau, Douglas Edward Brackley, Kevin Thomas Gahagan, Gary Edward Merz, Leon Robert Zoeller, III
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Publication number: 20100274525Abstract: Laser scanning measurement systems and methods are disclosed that allow for surface shape measurements of otherwise hidden portions of an object's surface. The system includes a laser system that scans a laser beam over a scan path, a photodetector that detects light reflected from the object's surface, and a processor adapted to process detector signals from the photodetector to determine a two-dimensional (2D) surface shape representation and a three-dimensional (3D) surface shape profile representation. The system includes a mirror(s) configured to direct the scanned laser beam to one or more portions of the object surface that cannot be directly irradiated by the laser, and that allows the photodetector to detect light reflected from the one or more hidden portions via the mirror(s).Type: ApplicationFiled: October 28, 2008Publication date: October 28, 2010Applicant: Corning IncorporatedInventor: Leon Robert Zoeller, III
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Publication number: 20100045975Abstract: Systems (50) and methods are disclosed for detecting defects (DEF1-DEF5) in a ceramic filter body (10) having a honeycomb structure (12) that defined multiple channels (20). Plugs (30) are used to seal select channel ends (22, 24). The methods include using a first light source unit (52) and a first detector unit (62) operably arranged at respective first and second ends (16, 18) of the honeycomb structure so as to be capable of being in optical communication. Light beams (LB) are transmitted from the first light source unit to the first detector unit through multiple channels. Defects in a given plug allow a detectable portion (LBD) of the corresponding light beam to be detected. Multiple detector elements (64) are used to detect the detectable light beam portion to provide location and intensity variation information, which helps deduce the precise location and nature of the defect.Type: ApplicationFiled: August 22, 2008Publication date: February 25, 2010Inventor: Leon Robert Zoeller, III
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Patent number: 7648549Abstract: A system, apparatus and method for detecting defects in a honeycomb body. The system and apparatus include a fixture adapted to hold the honeycomb body, a particulate fluid source, a pipe which defines a flow path between the particulate fluid source and a first end face of the honeycomb body thereby allowing particulate fluid to flow from the particulate fluid source to the first end face of the honeycomb body. The particulate fluid emerges at a second end face of the honeycomb body through defects, if any, in the honeycomb body where the positions of such defects may be monitored. The system and apparatus includes a flow straightener disposed in the flow path to minimize boundary layer influence of the pipe on the flow of the particulate fluid. A substantially uniform velocity flow profile is provided to the first end face of the honeycomb body.Type: GrantFiled: July 28, 2006Date of Patent: January 19, 2010Assignee: Corning IncorporatedInventors: Patrick Michael Gargano, Babak Robert Raj, William Paul Ryszytiwskyj, Michael George Shultz, David John Worthey, Leon Robert Zoeller, III
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Publication number: 20090315222Abstract: A method and system for manufacturing a mask for plugging cells in a honeycomb substrate includes capturing an image of the substrate's end through an end-adhered transparent or translucent film using a camera, forming openings using a laser, wherein a working distance, WDC, of the camera while capturing the image is substantially the same as a working distance, WDL, of the laser while forming the openings. Also disclosed is an apparatus for manufacturing a mask on a honeycomb substrate, having a laser to form openings in a film applied to the substrate's end; and an optical system, wherein either the optical system or the substrate is moveable between first and second operating positions. In a first embodiment, the camera moves whereas in the second, the substrate moves. In each embodiment, the image is obtained without obstructing the path of the laser.Type: ApplicationFiled: August 31, 2009Publication date: December 24, 2009Inventors: Edward Francis Andrewlavage, JR., David John Worthey, Leon Robert Zoeller, III
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Patent number: 7520918Abstract: A method and system for detecting defects in a plugged honeycomb structure includes forming a sheet of light having a first color across a first end face of the honeycomb structure, generating a first reflected signal from the sheet of light at a location corresponding to a cell containing a defect in the honeycomb structure, illuminating the first end face with an incident light beam having a second color, generating a second reflected signal from the incident light beam, and capturing an image of the first and second reflected signals. After being detected, the defective cells may then be marked or repaired without relocating the plugged honeycomb structure. Apparatus and methods for marking or repairing the defective cell(s) are described.Type: GrantFiled: December 16, 2005Date of Patent: April 21, 2009Assignee: Corning IncorporatedInventor: Leon Robert Zoeller, III
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Patent number: 7410528Abstract: A method for testing integrity of a plugged honeycomb structure includes forming a condenser at a first end of the honeycomb structure, passing a vaporous stream into a second end of the honeycomb structure, wherein a column of the vaporous stream emerges at the first end of the honeycomb structure from cells in the honeycomb structure that are defective, and observing the first end of the honeycomb structure for condensation spots formed by contact between the column of the vaporous stream emerging at the first end of the honeycomb structure and the condenser. An apparatus for accomplishing the method is also disclosed.Type: GrantFiled: November 22, 2005Date of Patent: August 12, 2008Assignee: Corning IncorporatedInventors: Ian Frederick Rae, Babak Robert Raj, William Paul Ryszytiwskyj, David John Worthey, Leon Robert Zoeller, III