Patents by Inventor Leon Vandervalk

Leon Vandervalk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10514328
    Abstract: The testing apparatus facilitates the testing of surfaces for contaminants such as soluble salts prior to applying a protective coating. The testing apparatus includes an air-permeable water-resistant membrane, an overlay, and a test chamber. When assembled, the testing apparatus provides an easily removable testing apparatus that encloses a void into which a solvent may be injected to determine the level of contamination of the surface.
    Type: Grant
    Filed: January 25, 2017
    Date of Patent: December 24, 2019
    Assignee: DEFELKSO CORPORATION
    Inventors: Leon Vandervalk, Steven Nowell, Nicholas Williams
  • Publication number: 20170261410
    Abstract: The testing apparatus facilitates the testing of surfaces for contaminants such as soluble salts prior to applying a protective coating. The testing apparatus includes an air-permeable water-resistant membrane, an overlay, and a test chamber. When assembled, the testing apparatus provides an easily removable and testing apparatus that encloses a void into which a solvent may be injected to determine the level of contamination of the surface.
    Type: Application
    Filed: January 25, 2017
    Publication date: September 14, 2017
    Applicant: DeFelsko Corporation
    Inventors: Leon VANDERVALK, Steven NOWELL, Nicholas WILLIAMS
  • Patent number: 9207174
    Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.
    Type: Grant
    Filed: February 20, 2015
    Date of Patent: December 8, 2015
    Assignee: DEFELSKO CORPORATION
    Inventors: Leon Vandervalk, Robert V. Stachnik, James Edward Davis
  • Patent number: 9188672
    Abstract: An ultrasonic measuring gauge includes a probe configured to be moved along a surface of a material to be measured, transmit ultrasonic waves to the material, and receive ultrasonic waves reflected from the material. The gauge also includes a processing unit and an input unit. The processing unit is configured to operate according to one of two different modes of operation based on an input received by the input unit. In a first mode of operation, the probe determines the thickness at portions between the first and second locations on the surface of the material at which the probe is coupled to the material regardless of whether the probe is continuously physically coupled between the two locations. In a second mode of operation, the processing unit determines a corresponding thickness of the material at each portion between two locations when the probe is continuously physically coupled between the two locations.
    Type: Grant
    Filed: April 13, 2012
    Date of Patent: November 17, 2015
    Assignee: DEFELSKO CORPORATION
    Inventor: Leon Vandervalk
  • Publication number: 20150233826
    Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.
    Type: Application
    Filed: February 20, 2015
    Publication date: August 20, 2015
    Applicant: DEFELSKO CORPORATION
    Inventors: Leon VANDERVALK, Robert V. STACHNIK, James Edward DAVIS
  • Patent number: 8994933
    Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.
    Type: Grant
    Filed: January 9, 2014
    Date of Patent: March 31, 2015
    Assignee: DeFelsko Corporation
    Inventors: Leon Vandervalk, Robert V. Stachnik, James Edward Davis
  • Publication number: 20140278257
    Abstract: A probe communications module interfaces with an interchangeable digital probe to transmit measurements to a computing device so that the operator may conveniently gather measurements using the interchangeable digital probe and, using the computing device, display, annotate, compare, and analyze the measurements.
    Type: Application
    Filed: March 11, 2014
    Publication date: September 18, 2014
    Applicant: DEFELSKO CORPORATION
    Inventor: Leon VANDERVALK
  • Publication number: 20140192346
    Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.
    Type: Application
    Filed: January 9, 2014
    Publication date: July 10, 2014
    Applicant: DEFELSKO CORPORATION
    Inventors: Leon VANDERVALK, ROBERT V. STACHNIK, JAMES EDWARD DAVIS
  • Publication number: 20130272094
    Abstract: An ultrasonic measuring gauge includes a probe configured to be moved along a surface of a material to be measured, transmit ultrasonic waves to the material, and receive ultrasonic waves reflected from the material. The gauge also includes a processing unit and an input unit. The processing unit is configured to operate according to one of two different modes of operation based on an input received by the input unit. In a first mode of operation, the probe determines the thickness at portions between the first and second locations on the surface of the material at which the probe is coupled to the material regardless of whether the probe is continuously physically coupled between the two locations. In a second mode of operation, the processing unit determines a corresponding thickness of the material at each portion between two locations when the probe is continuously physically coupled between the two locations.
    Type: Application
    Filed: April 13, 2012
    Publication date: October 17, 2013
    Applicant: Defelsko Corporation
    Inventor: Leon Vandervalk
  • Patent number: 5623427
    Abstract: A method and apparatus for measuring an anodic capacity of a thermally sprayed coating are described. Eddy current techniques are used to probe the coating and resulting RMS voltages are translated into anodic capacity indications which can be standardized or absolute. Recalibration can be achieved using single point measurement.
    Type: Grant
    Filed: September 2, 1994
    Date of Patent: April 22, 1997
    Assignee: DeFelsko Corporation
    Inventors: Leon Vandervalk, Frank J. Koch