Patents by Inventor Leon Vandervalk
Leon Vandervalk has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 10514328Abstract: The testing apparatus facilitates the testing of surfaces for contaminants such as soluble salts prior to applying a protective coating. The testing apparatus includes an air-permeable water-resistant membrane, an overlay, and a test chamber. When assembled, the testing apparatus provides an easily removable testing apparatus that encloses a void into which a solvent may be injected to determine the level of contamination of the surface.Type: GrantFiled: January 25, 2017Date of Patent: December 24, 2019Assignee: DEFELKSO CORPORATIONInventors: Leon Vandervalk, Steven Nowell, Nicholas Williams
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Publication number: 20170261410Abstract: The testing apparatus facilitates the testing of surfaces for contaminants such as soluble salts prior to applying a protective coating. The testing apparatus includes an air-permeable water-resistant membrane, an overlay, and a test chamber. When assembled, the testing apparatus provides an easily removable and testing apparatus that encloses a void into which a solvent may be injected to determine the level of contamination of the surface.Type: ApplicationFiled: January 25, 2017Publication date: September 14, 2017Applicant: DeFelsko CorporationInventors: Leon VANDERVALK, Steven NOWELL, Nicholas WILLIAMS
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Patent number: 9207174Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.Type: GrantFiled: February 20, 2015Date of Patent: December 8, 2015Assignee: DEFELSKO CORPORATIONInventors: Leon Vandervalk, Robert V. Stachnik, James Edward Davis
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Patent number: 9188672Abstract: An ultrasonic measuring gauge includes a probe configured to be moved along a surface of a material to be measured, transmit ultrasonic waves to the material, and receive ultrasonic waves reflected from the material. The gauge also includes a processing unit and an input unit. The processing unit is configured to operate according to one of two different modes of operation based on an input received by the input unit. In a first mode of operation, the probe determines the thickness at portions between the first and second locations on the surface of the material at which the probe is coupled to the material regardless of whether the probe is continuously physically coupled between the two locations. In a second mode of operation, the processing unit determines a corresponding thickness of the material at each portion between two locations when the probe is continuously physically coupled between the two locations.Type: GrantFiled: April 13, 2012Date of Patent: November 17, 2015Assignee: DEFELSKO CORPORATIONInventor: Leon Vandervalk
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Publication number: 20150233826Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.Type: ApplicationFiled: February 20, 2015Publication date: August 20, 2015Applicant: DEFELSKO CORPORATIONInventors: Leon VANDERVALK, Robert V. STACHNIK, James Edward DAVIS
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Patent number: 8994933Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.Type: GrantFiled: January 9, 2014Date of Patent: March 31, 2015Assignee: DeFelsko CorporationInventors: Leon Vandervalk, Robert V. Stachnik, James Edward Davis
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Publication number: 20140278257Abstract: A probe communications module interfaces with an interchangeable digital probe to transmit measurements to a computing device so that the operator may conveniently gather measurements using the interchangeable digital probe and, using the computing device, display, annotate, compare, and analyze the measurements.Type: ApplicationFiled: March 11, 2014Publication date: September 18, 2014Applicant: DEFELSKO CORPORATIONInventor: Leon VANDERVALK
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Publication number: 20140192346Abstract: An apparatus and method are provided for characterizing a replica tape which has been embossed, compressed or cast on a surface of a material to be measured to replicate that surface. The replica tape is secured between first and second holding components such that a compressible surface of the replica tape is secured against the first holding component. A light source transmits light through the second holding component, the replica tape and the first holding component. An image sensor measures intensity of the light respectively transmitted through at least two measurement points of the compressible surface of the replica tape. A processing unit converts the measured light intensity transmitted through the at least two measurement points into at least two data values each respectively relating to a measurement statistic of the replica tape at a corresponding one of the at least two measurement points, respectively.Type: ApplicationFiled: January 9, 2014Publication date: July 10, 2014Applicant: DEFELSKO CORPORATIONInventors: Leon VANDERVALK, ROBERT V. STACHNIK, JAMES EDWARD DAVIS
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Publication number: 20130272094Abstract: An ultrasonic measuring gauge includes a probe configured to be moved along a surface of a material to be measured, transmit ultrasonic waves to the material, and receive ultrasonic waves reflected from the material. The gauge also includes a processing unit and an input unit. The processing unit is configured to operate according to one of two different modes of operation based on an input received by the input unit. In a first mode of operation, the probe determines the thickness at portions between the first and second locations on the surface of the material at which the probe is coupled to the material regardless of whether the probe is continuously physically coupled between the two locations. In a second mode of operation, the processing unit determines a corresponding thickness of the material at each portion between two locations when the probe is continuously physically coupled between the two locations.Type: ApplicationFiled: April 13, 2012Publication date: October 17, 2013Applicant: Defelsko CorporationInventor: Leon Vandervalk
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Patent number: 5623427Abstract: A method and apparatus for measuring an anodic capacity of a thermally sprayed coating are described. Eddy current techniques are used to probe the coating and resulting RMS voltages are translated into anodic capacity indications which can be standardized or absolute. Recalibration can be achieved using single point measurement.Type: GrantFiled: September 2, 1994Date of Patent: April 22, 1997Assignee: DeFelsko CorporationInventors: Leon Vandervalk, Frank J. Koch