Patents by Inventor Leonard A. Hayden

Leonard A. Hayden has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Wafer probe
    Publication number: 20020075019
    Abstract: The present invention relates to a probe for testing of integrated circuits or other microelectronic devices.
    Type: Application
    Filed: November 19, 2001
    Publication date: June 20, 2002
    Inventors: Leonard Hayden, John Martin, Mike Andrews
  • Probe station having multiple enclosures
    Publication number: 20020050831
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Application
    Filed: December 7, 2001
    Publication date: May 2, 2002
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Probe station having multiple enclosures
    Patent number: 6362636
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: July 17, 2001
    Date of Patent: March 26, 2002
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Probe station having multiple enclosures
    Publication number: 20020027442
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Application
    Filed: July 17, 2001
    Publication date: March 7, 2002
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Probe station having inner and outer shielding
    Patent number: 6288557
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: November 30, 1999
    Date of Patent: September 11, 2001
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Probe station having inner and outer shielding
    Patent number: 6002263
    Abstract: A probe station for probing a test device has a chuck element for supporting the test device. An electrically conductive outer shield enclosure at least partially encloses such chuck element to provide EMI shielding therefor. An electrically conductive inner shield enclosure is interposed between and insulated from the outer shield enclosure and the chuck element, and at least partially encloses the chuck element.
    Type: Grant
    Filed: June 6, 1997
    Date of Patent: December 14, 1999
    Assignee: Cascade Microtech, Inc.
    Inventors: Ron A. Peters, Leonard A. Hayden, Jeffrey A. Hawkins, R. Mark Dougherty
  • Step transition time reduction for filtered oscillators
    Patent number: 4827227
    Abstract: A step transition time reduction technique for a YIG oscillator having a capacitive filter uses an inverse transfer function to produce a predistorted drive step signal from an input drive step signal, the predistorted drive step signal being used to drive the YIG oscillator. The inverse transfer function uses R,L,C values from the oscillator circuit to generate an intermediate step in the input drive step signal, the value of the step being determined by a factor k=1/(1+e.sup.-a*pi/b) and the duration of the step being determined by a delay time dt=pi/b, where a=R/(2L) and b=(1/(LC)-R.sup.2 /(4L.sup.2)).sup.1/2.
    Type: Grant
    Filed: July 15, 1988
    Date of Patent: May 2, 1989
    Assignee: Tektronix, Inc.
    Inventors: Leonard A. Hayden, Robert W. Bales