Patents by Inventor Leonard H. Bieman

Leonard H. Bieman has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6956963
    Abstract: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a light source for propagating light to the device and an image detector that receives light from the device. Also included is a light sensor assembly for receiving a portion of the light from the light source. The light sensor assembly produces an output signal responsive to the intensity of the light received at the light sensor assembly. A controller controls the amount of light received by the image detector to a desired intensity range in response to the output from the light sensor. The image detector may include an array of imaging pixels.
    Type: Grant
    Filed: January 8, 2001
    Date of Patent: October 18, 2005
    Assignee: Ismeca Europe Semiconductor SA
    Inventors: Franz W. Ulrich, Leonard H. Bieman
  • Patent number: 6541757
    Abstract: The subject invention is an optical detection assembly (26) for detecting dispensed material (28). The detection assembly (26) includes a housing (38) having a number of optical sensors (42) mounted to the housing (38). A material applicator (30) is mounted within a central opening (44) of the housing (38) and extends through the opening (44) such that the sensors (42) substantially surround the applicator (30) to continuously detect the material (28) being dispensed through the applicator (30). The subject invention also includes the method of detecting the material (28) being dispensed upon a workpiece (32) utilizing a robotic apparatus (20) having an articulated arm (24) with the housing (38) mounted to the arm (24).
    Type: Grant
    Filed: February 21, 2001
    Date of Patent: April 1, 2003
    Assignee: Fanuc Robotics North America, Inc.
    Inventors: Leonard H. Bieman, Edward W. Roney
  • Publication number: 20030039388
    Abstract: Manufacturing lines include inspection systems for monitoring the quality of parts produced. Manufacturing lines for making semiconductor devices generally inspect each fabricated part. The information obtained is used to fix manufacturing problems in the semiconductor fab plant. A machine-vision system for inspecting devices includes a light source for propagating light to the device and an image detector that receives light from the device. Also included is a light sensor assembly for receiving a portion of the light from the light source. The light sensor assembly produces an output signal responsive to the intensity of the light received at the light sensor assembly. A controller controls the amount of light received by the image detector to a desired intensity range in response to the output from the light sensor. The image detector may include an array of imaging pixels.
    Type: Application
    Filed: January 8, 2001
    Publication date: February 27, 2003
    Inventors: Franz W. Ulrich, Leonard H. Bieman
  • Publication number: 20020163573
    Abstract: An imaging system for creating a three dimensional image of an object. The imaging system includes a housing and three sets of light sources mounted to the housing. The light sources are selectively illuminated for projecting light on the object. A camera is spaced from the housing for capturing projected light reflecting from the object. A lens and a diffuser are mounted to the housing and are spaced from the light sources for focusing and blurring the projected light to define an image projected upon the object. A controller is connected to the light sources for sequentially illuminating the light sources to produce at least three different images on the object. The controller is also connected to the camera for controlling the camera to capture the different images for creating the three dimensional image of the object.
    Type: Application
    Filed: April 11, 2001
    Publication date: November 7, 2002
    Inventors: Leonard H. Bieman, Gary Rutledge
  • Publication number: 20020113198
    Abstract: The subject invention is an optical detection assembly (26) for detecting dispensed material (28). The detection assembly (26) includes a housing (38) having a number of optical sensors (42) mounted to the housing (38). A material applicator (30) is mounted within a central opening (44) of the housing (38) and extends through the opening (44) such that the sensors (42) substantially surround the applicator (30) to continuously detect the material (28) being dispensed through the applicator (30). The subject invention also includes the method of detecting the material (28) being dispensed upon a workpiece (32) utilizing a robotic apparatus (20) having an articulated arm (24) with the housing (38) mounted to the arm (24).
    Type: Application
    Filed: February 21, 2001
    Publication date: August 22, 2002
    Applicant: FANUC Robotics North America, Inc.
    Inventors: Leonard H. Bieman, Edward W. Roney
  • Patent number: 6122062
    Abstract: A 3-D camera system (10) includes a light source (12) and a grating (14) spaced at a predetermined distance from the light source (12). The light source (12) and grating (14) project a shadow of the grating (14) on an object (16). Images of the object (16) with the grating (14) shadows projected thereon are captured by a sensor (18) in a video camera (17). A processor (19) converts the images to a three dimensional bit map of the object (16). The light source (12) includes a plurality of at least three rows of light sources (20) defining a matrix (22) whereby different rows of the matrix (22) may be illuminated to produce different grating (14) shadows on the object (16).
    Type: Grant
    Filed: May 3, 1999
    Date of Patent: September 19, 2000
    Assignee: FANUC Robotics North America, Inc.
    Inventors: Leonard H. Bieman, Gary Rutledge
  • Patent number: 5959425
    Abstract: A method of controlling a robot system (20) includes using a camera (40) to generate a first, two-dimensional image of a marking (42) on a workpiece (32). A second, two-dimensional image of the marking (42) is generated from a second perspective. The two images are then used to generate a three-dimensional location of the marking in real space relative to the robot (22). Since the visible marking (42) corresponds to a desired path (48), the three-dimensional location information is used to automatically program the robot (22) to follow the desired path.
    Type: Grant
    Filed: October 15, 1998
    Date of Patent: September 28, 1999
    Assignee: FANUC Robotics North America, Inc.
    Inventors: Leonard H. Bieman, Gary J. Rutledge
  • Patent number: 5933231
    Abstract: An optical method and system for measuring bore hole diameter, out-of-roundness and lobing and a probe for use therein are provided. A ring of structured light is initially formed or projected on the inner surface of a bore hole by optical components supported within a housing of the probe. A lens system also supported within the housing images the ring of light. Image merging lenses of the lens system reform the image at a video camera located at a window of the housing such that two or more arcs of the ring form a magnified image with the image of the arcs being shifted in space such that all the arcs can be viewed by the camera. The video camera image is captured by a frame grabber/computer. A computer calculates the location of the arcs and from this information determine bore diameter and other bore properties such as out-of-roundness and lobing.
    Type: Grant
    Filed: July 10, 1996
    Date of Patent: August 3, 1999
    Assignee: Industrial Technology Institute
    Inventors: Leonard H. Bieman, Kevin G. Harding
  • Patent number: 5646733
    Abstract: A method and system are provided including an optical head which moves relative to an object at a vision station to scan a projected pattern of imagable electromagnetic radiation across the surface of an object to be inspected at a relatively constant linear rate to generate an imagable electromagnetic radiation signal. In one embodiment, the electromagnetic radiation is light to develop dimensional information associated with the object. The optical head includes at least one projector which projects a grid of lines and an imaging subsystem which includes a trilinear array camera as a detector. The camera and the at least one projector are maintained in fixed relation to each other. Three linear detector elements of the array camera extend in a direction parallel with the grid of lines. The geometry of the optical head is arranged in such a way that each linear detector element picks up a different phase in the grid pattern.
    Type: Grant
    Filed: January 29, 1996
    Date of Patent: July 8, 1997
    Assignee: Medar, Inc.
    Inventor: Leonard H. Bieman
  • Patent number: 5636025
    Abstract: An optical measuring system comprises an illumination arrangement including a light source, grating, and lens, and an image acquisition arrangement, including a lens, grating, and camera. A mechanical translation device moves the grating in a plane parallel to a reference surface to effect a phase shift of a projected image of the grating on the contoured surface to be measured. A second mechanical translation device moves the lens to effect a change in the contour interval. A first phase of the points on the contoured surface is taken, via a four-bucket algorithm, at a first contour interval. A second phase of the points is taken at a second contour interval. A controller, including a computer, determines a coarse measurement using the difference between the first and second phases. The controller further determines a fine measurement using either the first or second phase.
    Type: Grant
    Filed: June 17, 1994
    Date of Patent: June 3, 1997
    Assignee: MEDAR, Inc.
    Inventors: Leonard H. Bieman, Mark A. Michniewicz
  • Patent number: 4647208
    Abstract: The three-dimensional position of a hole through a workpiece is determined using back lighting or front lighting (feature lighting) to determine the centroid of the hole's image in two-dimensional computer memory image space. The centroid determines a line of sight between the center of the hole's image and the actual center of the hole in real space. Next a crosshair lighting pattern (structured lighting) is projected onto the plane of the workpiece in the neighborhood of the hole. From the reflected crosshair pattern an equation representing the plane containing the hole is determined in image space. The intersection of the plane equation and the line of sight is computed and the three-dimensional, real space position of the hole is determined for comparision with an ideal position established during calibration.
    Type: Grant
    Filed: July 22, 1985
    Date of Patent: March 3, 1987
    Assignee: Perceptron, Inc.
    Inventor: Leonard H. Bieman
  • Patent number: RE39978
    Abstract: A method and system are provided including an optical head which moves relative to an object at a vision station to scan a projected pattern of imagable electromagnetic radiation across the surface of an object to be inspected at a relatively constant linear rate to generate an imagable electromagnetic radiation signal. In one embodiment, the electromagnetic radiation is light to develop dimensional information associated with the object. The optical head includes at least one projector which projects a grid of lines and an imaging subsystem which includes a trilinear array camera as a detector. The camera and the at least one projector are maintained in fixed relation to each other. Three linear detector elements of the array camera extend in a direction parallel with the grid of lines. The geometry of the optical head is arranged in such a way that each linear detector element picks up a different phase in the grid pattern.
    Type: Grant
    Filed: July 8, 1998
    Date of Patent: January 1, 2008
    Assignee: Ismeca Europe Semiconductor SA
    Inventor: Leonard H. Bieman