Patents by Inventor Leroy R. Bannach

Leroy R. Bannach has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Digitally linearizing eddy current probe
    Patent number: 5854553
    Abstract: The output of an eddy current probe is demodulated and subsequently linearized using an analog to digital converter, a digital signal processor, and a memory. The linearized digital output signal is converted back to an analog signal, the voltage of which is preferably directly proportional to the position of the conductive target in relation to the probe.
    Type: Grant
    Filed: June 19, 1996
    Date of Patent: December 29, 1998
    Assignee: SKF Condition Monitoring
    Inventors: John T. Barclay, Phillip L. Maness, Leroy R. Bannach