Abstract: A sense circuit for detecting charge on a TFT/LCD cell capacitor, which comprises a first, integrating circuit attached to the TFT/LCD cell capacitor through a data line, wherein the data line is connected to the cell capacitance through a thin film transistor is disclosed. The thin film transistor including a gate, a drain and a source, wherein the source is connected to the cell capacitor and the drain is connected to the data line. A first, gate supply voltage adapted to drive the gate of the thin film transistor. And a reset circuit adapted to reset the integrating circuit. This embodiment may further include a source for charging said cell capacitor prior to measuring the charge. Further, a method of testing a partially constructed electronic circuit, for example the cell of an LCD, prior to installation of the backplate is also disclosed. The partial circuit comprising an array of contact electrodes, for example cell pad electrodes and an array of address electrodes, for example gate electrodes.

Abstract: An apparatus for testing for and classifying defects in a TFT/LCD array having gate lines and data lines. Devices are provided for activating cells of the array by applying gate pulses to the gate lines and pulses to the data lines. Devices are also provided for acquiring waveforms from data lines of the array. Additional devices sample the waveforms at selected points in time. A computer may be used to classify the waveforms to indicate whether defects are present and if present, the nature of the defects by comparing voltages of the waveform at the selected points in time.

Abstract: A sense circuit for detecting charge on a TFT/LCD cell capacitor, which comprises a first, integrating circuit attached to the TFT/LCD cell capacitor through a data line, wherein the data line is connected to the cell capacitance through a thin film transistor. The thin film transistor including a gate, a drain and a source, wherein the source is connected to the cell capacitor and the drain is connected to the data line. A first, gate supply voltage adapted to drive the gate of the thin film transistor. And a reset circuit adapted to reset the integrating circuit. This embodiment may further include a source for charging said cell capacitor prior to measuring the charge. Further, a method of testing a partially constructed electronic circuit, for example the cell of an LCD, prior to installation of the backplate. The partial circuit comprising an array of contact electrodes, for example cell pad electrodes and an array of address electrodes, for example gate electrodes.