Patents by Inventor Leslie J. Kirihara

Leslie J. Kirihara has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7246522
    Abstract: A multiparameter acoustic signature inspection device and method are described for non-invasive inspection of containers. Dual acoustic signatures discriminate between various fluids and materials for identification of the same.
    Type: Grant
    Filed: February 24, 2006
    Date of Patent: July 24, 2007
    Assignee: Battelle Memorial Institute
    Inventors: Aaron A. Diaz, Todd J. Samuel, Juan D. Valencia, Kevin L. Gervais, Brian J. Tucker, Leslie J. Kirihara, James R. Skorpik, Larry D. Reid, John T. Munley, Richard A. Pappas, Bob W. Wright, Paul D. Panetta, Jason S. Thompson
  • Patent number: 6853951
    Abstract: Methods and systems for identifying, understanding, and predicting the degradation and failure of mechanical systems are disclosed. The methods include measuring and quantifying stressors that are responsible for the activation of degradation mechanisms in the machine component of interest. The intensity of the stressor may be correlated with the rate of physical degradation according to some determinable function such that a derivative relationship exists between the machine performance, degradation, and the underlying stressor. The derivative relationship may be used to make diagnostic and prognostic calculations concerning the performance and projected life of the machine. These calculations may be performed in real time to allow the machine operator to quickly adjust the operational parameters of the machinery in order to help minimize or eliminate the effects of the degradation mechanism, thereby prolonging the life of the machine. Various systems implementing the methods are also disclosed.
    Type: Grant
    Filed: December 9, 2002
    Date of Patent: February 8, 2005
    Assignee: Battelle Memorial Institute
    Inventors: Donald B. Jarrell, Daniel R. Sisk, Darrel D. Hatley, Leslie J. Kirihara, Timothy J. Peters
  • Publication number: 20040030524
    Abstract: Methods and systems for identifying, understanding, and predicting the degradation and failure of mechanical systems are disclosed. The methods include measuring and quantifying stressors that are responsible for the activation of degradation mechanisms in the machine component of interest. The intensity of the stressor may be correlated with the rate of physical degradation according to some determinable function such that a derivative relationship exists between the machine performance, degradation, and the underlying stressor. The derivative relationship may be used to make diagnostic and prognostic calculations concerning the performance and projected life of the machine. These calculations may be performed in real time to allow the machine operator to quickly adjust the operational parameters of the machinery in order to help minimize or eliminate the effects of the degradation mechanism, thereby prolonging the life of the machine. Various systems implementing the methods are also disclosed.
    Type: Application
    Filed: December 9, 2002
    Publication date: February 12, 2004
    Applicant: Battelle Memorial Institute
    Inventors: Donald B. Jarrell, Daniel R. Sisk, Darrel D. Hatley, Leslie J. Kirihara, Timothy J. Peters
  • Patent number: 6668039
    Abstract: An X-ray fluorescence device and method are disclosed. The device includes a source block containing an X-ray source, a substantially X-ray transparent fluid flow path through the source block and proximate the X-ray source, and an X-ray detector separated from the X-ray source by the source block. First and second openings are provided in the source block between the X-ray source and the flow path and between the flow path and the detector respectively. In operation, source X-rays pass through the first opening and through the flow path. A portion of the source X-rays interact with a fluid in the flow path to create a fluid fluorescence response. The remainder of the source X-rays pass into a noise reduction cavity of the source block. The detector receives the portion of the fluid fluorescence response passing through the second opening and produces an output indicative of the presence and amount of selected components in the fluid.
    Type: Grant
    Filed: January 7, 2002
    Date of Patent: December 23, 2003
    Assignee: Battelle Memorial Institute
    Inventors: Chester L. Shepard, Bary W. Wilson, Leslie J. Kirihara, John T. Munley, James H. Reeves
  • Publication number: 20030128805
    Abstract: An X-ray fluorescence device and method are disclosed. The device includes a source block containing an X-ray source, a substantially X-ray transparent fluid flow path through the source block and proximate the X-ray source, and an X-ray detector separated from the X-ray source by the source block. First and second openings are provided in the source block between the X-ray source and the flow path and between the flow path and the detector respectively. In operation, source X-rays pass through the first opening and through the flow path. A portion of the source X-rays interact with a fluid in the flow path to create a fluid fluorescence response. The remainder of the source X-rays pass into a noise reduction cavity of the source block. The detector receives the portion of the fluid fluorescence response passing through the second opening and produces an output indicative of the presence and amount of selected components in the fluid.
    Type: Application
    Filed: January 7, 2002
    Publication date: July 10, 2003
    Inventors: Chester L. Shepard, Bary W. Wilson, Leslie J. Kirihara, John T. Munley, James H. Reeves
  • Patent number: 4956558
    Abstract: A system for determining the thicknesses of thin films of materials exhibiting fluorescence in response to exposure to excitation energy from a suitable source of such energy. A section of film is illuminated with a fixed level of excitation energy from a source such as an argon ion laser emitting blue-green light. The amount of fluorescent light produced by the film over a limited area within the section so illuminated is then measured using a detector such as a photomultiplier tube. Since the amount of fluorescent light produced is a function of the thicknesses of thin films, the thickness of a specific film can be determined by comparing the intensity of fluorescent light produced by this film with the intensity of light produced by similar films of known thicknesses in response to the same amount of excitation energy.
    Type: Grant
    Filed: March 16, 1989
    Date of Patent: September 11, 1990
    Assignee: Battelle Memorial Institute
    Inventors: Charles R. Batishko, Leslie J. Kirihara, Timothy J. Peters, Donald E. Rasmussen