Patents by Inventor Let-Long Chen

Let-Long Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for check-in control in wafer testing
    Patent number: 7123040
    Abstract: A testing system for check-in control in wafer testing. The testing system comprises a testing tool, an optical character recognition (OCR) device, and a controller. The testing tool performs a testing process of an article. The OCR device reads optical characters disposed on the article. The controller, connected to the testing tool and the OCR device, automatically initiates a check-in process for the article according to the read optical characters.
    Type: Grant
    Filed: March 4, 2004
    Date of Patent: October 17, 2006
    Assignee: Taiwan Semiconductor Manufacturing Co., Ltd.
    Inventors: Keng-Chia Yang, Chih-Chien Chen, Let-Long Chen