Abstract: A test socket for integrated circuits in rectangular packages having contact pads or leads. The test socket has an insulating body with a top opening into which a package may be inserted and latched in place by electrical contact elements that also make electrical connection to the pads or leads on the package. After the integrated circuit has been tested the package may be removed from the test socket by depressing it past the latching position to cause an unlatching cam to move the contact elements to an unlatching position and a resiliently loaded ejector member to thereafter carry the package past the latching position and out of the test socket.