Patents by Inventor Lewis Nardini

Lewis Nardini has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 9702935
    Abstract: Apparatus and method for testing an integrated circuit. An integrated circuit includes circuitry to be tested, scan chain logic, and a test adapter. The scan chain logic is configured to transfer test data to and test results from the circuitry. The test adapter is configured to extract the test data from a packet received from an automated test control system and to transfer the test data to the scan chain logic. The test adapter is also configured to receive the test results from the scan chain logic, and to packetize the test result for transmission to the automated test control system.
    Type: Grant
    Filed: August 29, 2014
    Date of Patent: July 11, 2017
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Lewis Nardini, Sumant Kale, Alan Hales
  • Patent number: 9098438
    Abstract: A method is provided for scaling voltage in an integrated circuit. A calibration operation is performed on a functional module on the integrated circuit periodically at a rate T1. At least one parameter on the integrated circuit in monitored to determine when a performance threshold is reached. A change is initiated to an operating voltage for a portion of the integrated circuit in response to reaching the threshold. The rate of performing calibration operation is increased to a higher rate T2 for a window of time W in response to initiating the change in operating voltage, after which the rate of performing calibration is returned to the rate T1.
    Type: Grant
    Filed: August 25, 2011
    Date of Patent: August 4, 2015
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Jose Luis Flores, Lewis Nardini, Ritesh Sojitra, Denis Roland Beaudoin
  • Publication number: 20150067426
    Abstract: Apparatus and method for testing an integrated circuit. An integrated circuit includes circuitry to be tested, scan chain logic, and a test adapter. The scan chain logic is configured to transfer test data to and test results from the circuitry. The test adapter is configured to extract the test data from a packet received from an automated test control system and to transfer the test data to the scan chain logic. The test adapter is also configured to receive the test results from the scan chain logic, and to packetize the test result for transmission to the automated test control system.
    Type: Application
    Filed: August 29, 2014
    Publication date: March 5, 2015
    Inventors: Lewis Nardini, Sumant Kale, Alan Hales
  • Patent number: 8655637
    Abstract: An memory access address comparator includes two comparators comparing an input memory access address with respective reference addresses. The comparators produce a match indication on selectable criteria, such as address size, full or partial overlap, greater than, less than, equal to, not equal to, less than or equal to, and greater than or equal to, and can be selectively chained. Input multiplexers permit memory access address bus selection. The comparator output may be selectively dependent upon corresponding data matches. The reference addresses, comparison data and control functions are enabled via central processing unit accessible memory mapped registers.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: February 18, 2014
    Assignee: Texas Instruments Incorporated
    Inventors: Jose L. Flores, Lewis Nardini, Maria B. H. Gill
  • Patent number: 8401835
    Abstract: In the case of tracing processor activity and generating data streams multiple triggers can be generated at the same time. The issue is further complicated in a protected pipeline where certain locations are considered as in illegal instruction boundary. During those cycles certain information is invalid and cannot be transmitted to the user. Thus a received trace trigger cannot begin. This invention resolves all ambiguities related to multiple triggers so that the user has a known predictable behavior based on the setup of the triggers.
    Type: Grant
    Filed: November 22, 2002
    Date of Patent: March 19, 2013
    Assignee: Texas Instruments Incorporated
    Inventors: Manisha Agarwala, John M. Johnsen, Lewis Nardini
  • Patent number: 8201004
    Abstract: An embedded megamodule and an embedded CPU enable power-saving through a combination of hardware and software. The CPU configures the power-down controller (PDC) logic within megamodule and can software trigger a low-power state of logic modules during processor IDLE periods. To wake from this power-down state, a system event is asserted to the CPU through the module interrupt controller. Thus the entry into a low-power state is software-driven during periods of inactivity and power restoration is on system activity that demands the attention of the CPU.
    Type: Grant
    Filed: September 14, 2007
    Date of Patent: June 12, 2012
    Assignee: Texas Instruments Incorporated
    Inventors: Timothy David Anderson, Lewis Nardini, Jose Luis Flores, Abhijeet Chachad, Raguram Damodaran, Joseph R. M. Zbiciak, Gary Swoboda
  • Publication number: 20120084575
    Abstract: A method is provided for scaling voltage in an integrated circuit. A calibration operation is performed on a functional module on the integrated circuit periodically at a rate T1. At least one parameter on the integrated circuit in monitored to determine when a performance threshold is reached. A change is initiated to an operating voltage for a portion of the integrated circuit in response to reaching the threshold. The rate of performing calibration operation is increased to a higher rate T2 for a window of time W in response to initiating the change in operating voltage, after which the rate of performing calibration is returned to the rate T1.
    Type: Application
    Filed: August 25, 2011
    Publication date: April 5, 2012
    Inventors: Jose Luis Flores, Lewis Nardini, Ritesh Sojitra, Denis Roland Beaudoin
  • Patent number: 7925687
    Abstract: A saturating count counts received event signals up to a first predetermined number. An overflow counter counts overflows up to a second predetermined number. The counter indicates overflow when the overflow count is non-zero and saturates and stops counting at a maximum count when the overflow count reaches the second predetermined number. The counter can be read via a register read operation. The sum of the sum of the first predetermined number of bits and the second predetermined number of bits being an integral multiple of 8 bits.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: April 12, 2011
    Assignee: Texas Instruments Incorporated
    Inventors: Manisha Agarwala, John M. Johnsen, Lewis Nardini
  • Patent number: 7774758
    Abstract: The present disclosure describes methods and systems for secure debugging and profiling of a computer system. Some illustrative embodiments may include a system including a processor with a first processing stage and a first attribute register associated with the first processing stage, and including a memory system coupled to the processor. An instruction and an attribute value are stored within the memory system, wherein the instruction is loaded into the first processing stage and the attribute value is loaded into the first attribute register. Export of debug and profiling data from the first processing stage is disabled if the attribute value in the first attribute register indicates that the instruction in the first processing stage is a secure instruction, and further indicates that secure emulation is disabled.
    Type: Grant
    Filed: May 15, 2006
    Date of Patent: August 10, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Manisha Agarwala, Oliver P. Sohm
  • Patent number: 7716034
    Abstract: A method of trace data compression receives trace data on a first port and a second port stores a prior data value. If trace data is received on only one port, then that trace data is transmitted as an indication of matching and non-matching sections between the current trace data and the stored data value and the non-matching sections of the current trace data on the one port. If trace data is received on both ports, then the first port trace data is transmitted relative to the prior stored value and the second port trace data is transmitted relative to the first port trace data. The stored prior data is reset to zero upon each initiation or termination of trace data on either port. The stored prior value is set to the second port value or the first port value if no second port value is received.
    Type: Grant
    Filed: August 28, 2006
    Date of Patent: May 11, 2010
    Assignee: Texas Instruments Incorporated
    Inventors: Manisha Agarwala, Lewis Nardini, John M. Johnsen, Maria B. H. Gill, Jose L. Flores
  • Patent number: 7610518
    Abstract: An program counter address comparator includes two comparators comparing an input program counter address with respective reference addresses. The comparators produce a match indication on selectable criteria, such as greater than, less than, equal to, not equal to, less than or equal to, and greater than or equal to, and can be selectively chained. Input multiplexers permit selection of either the program counter address bus or a secondary address bus. The reference addresses and control functions are enabled via central processing unit accessible memory mapped registers.
    Type: Grant
    Filed: August 28, 2006
    Date of Patent: October 27, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Jose L. Flores, Lewis Nardini, Maria B. H. Gill
  • Patent number: 7606696
    Abstract: This invention provides trace address compression by comparing respective bytes of a current trace address with a stored comparison address. Only the least significant bytes of the current trace address that do not match the comparison address or are less significant than any section of the current trace address that does not match the comparison address are transmitted. This sometimes reduces the amount of data that needs to be transmitted. The comparison address is specified by a central processing unit via a memory mapped register write operation.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: October 20, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Manisha Agarwala, John M. Johnsen
  • Patent number: 7562170
    Abstract: This invention provides trace address compression by comparing respective bytes of a current trace address with a stored comparison address. Only the least significant bytes of the current trace address that do not match the comparison address or are less significant than any section of the current trace address that does not match the comparison address are transmitted. This sometimes reduces the amount of data that needs to be transmitted. The comparison address is specified by a central processing unit via a memory mapped register write operation.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: July 14, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Manisha Agarwala, John M. Johnsen
  • Patent number: 7558987
    Abstract: A system comprising a target hardware comprising multiple processor cores and an application. The system also comprises a host computer coupled to the target hardware by way of a connection and adapted to debug the application by receiving trace information via the connection. In determining which trace information to send via the connection, the target hardware gives priority to trace information generated by a primary processor core associated with a token over trace information generated by a secondary processor core not associated with the token. The token is associated with one of the multiple processor cores at a time.
    Type: Grant
    Filed: August 29, 2006
    Date of Patent: July 7, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Manisha Agarwala, Neil Common
  • Patent number: 7502727
    Abstract: This invention tracks emulation changes in the program counter of the central processing unit of a data processor during emulation halt. The sequence includes: pausing the central processing unit in response to an emulation halt; employing the emulator to change the program counter. In this case when the central processing unit resumes operation, there will be a discontinuity in the program counter. The trace data will show a change in the program counter address. This invention uses a unique exception signal similar to those used to mark interrupts to inform the user that this program counter discontinuity is due to an emulation change of the program counter during emulation halt.
    Type: Grant
    Filed: November 22, 2002
    Date of Patent: March 10, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Manisha Agarwala, Lewis Nardini, Timothy D. Anderson
  • Patent number: 7475172
    Abstract: This invention provides trace address compression by comparing respective bytes of a current trace address with a stored prior trace address. Only the least significant bytes of the current trace address that do not match the stored prior trace address or are less significant than any section of the current trace address that does not match the stored prior trace address are transmitted. This sometimes reduces the amount of data that needs to be transmitted. The prior trace address may be updated with the current trace address if there is a complete mismatch.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: January 6, 2009
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Manisha Agarwala, John M. Johnsen
  • Patent number: 7469372
    Abstract: A scan sequenced initialization technique supplies a predefined power-on state to a device or module without using explicit reset input to the registers. This technique supplies a predefined pattern to parallel scan chains following power-on reset. The predefined pattern places the device or module in a architecturally specified reset state. The parallel scan chains are required for structural manufacturing test. Once the power-on reset scanning is complete, the power-on reset sequencer indicates completion of state initialization to other circuits.
    Type: Grant
    Filed: May 4, 2006
    Date of Patent: December 23, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Alan D. Hales
  • Patent number: 7444504
    Abstract: A method of tracing a data processor upon reset of the data processor. A data processor reset signal resets the data processor, part of trace collection hardware and does not reset remaining parts of trace collection hardware. The data processor reset signal may be not owned, owned by an application program or owned by a debugger. The partial not reset of the trace collection hardware occurs only upon a data processor reset signal owned by the debugger. A trace logic reset signal resets both the data processor and the trace collection hardware when not owned. This trace logic reset signal resets the data processor only when owned by the debugger and resets the trace collection hardware when owned by an application program.
    Type: Grant
    Filed: June 20, 2007
    Date of Patent: October 28, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Manisha Agarwala, Lewis Nardini
  • Patent number: 7383367
    Abstract: This invention provides trace address compression by comparing respective bytes of a current trace address with a stored prior trace address. Only the least significant bytes of the current trace address that do not match the stored prior trace address or are less significant than any section of the current trace address that does not match the stored prior trace address are transmitted. This sometimes reduces the amount of data that needs to be transmitted. The prior trace address may be updated with the current trace address if there is a complete mismatch.
    Type: Grant
    Filed: December 5, 2006
    Date of Patent: June 3, 2008
    Assignee: Texas Instruments Incorporated
    Inventors: Lewis Nardini, Manisha Agarwala, John M. Johnsen
  • Patent number: RE46193
    Abstract: An embedded megamodule and an embedded CPU enable power-saving through a combination of hardware and software. The CPU configures the power-down controller (PDC) logic within megamodule and can software trigger a low-power state of logic modules during processor IDLE periods. To wake from this power-down state, a system event is asserted to the CPU through the module interrupt controller. Thus the entry into a low-power state is software-driven during periods of inactivity and power restoration is on system activity that demands the attention of the CPU.
    Type: Grant
    Filed: June 12, 2014
    Date of Patent: November 1, 2016
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Timothy David Anderson, Lewis Nardini, Jose Luis Flores, Abhijeet Chachad, Raguram Damodaran, Joseph R. M. Zbiciak, Gary Swoboda