Patents by Inventor Li Chang-Tsun

Li Chang-Tsun has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Methods for identifying imaging devices and classifying images acquired by unknown imaging devices
    Patent number: 8565529
    Abstract: A method of classifying an image taken by an image capture device, the method comprising the steps of: extracting an initial Sensor Noise Pattern (SNP) for the image; enhancing the initial SNP to create an enhanced SNP by applying a correcting model, wherein the correcting model scales the initial SNP by a factor inversely proportional to the signal intensity of the initial SNP; determining a similarity measure between the enhanced SNP for said image with one or more previously calculated enhanced SNPs for one or more different images; and classifying the image in a group of one or more images with similar or identical SNPs based on the determined similarity measure.
    Type: Grant
    Filed: February 15, 2010
    Date of Patent: October 22, 2013
    Assignee: Forensic Pathways Limited
    Inventors: Li Chang-Tsun, Richard Leary
  • METHODS FOR IDENTIFYING IMAGING DEVICES AND CLASSIFYING IMAGES ACQUIRED BY UNKNOWN IMAGING DEVICES
    Publication number: 20120087589
    Abstract: A method of classifying an image taken by an image capture device, the method comprising the steps of: extracting an initial Sensor Noise Pattern (SNP) for the image; enhancing the initial SNP to create an enhanced SNP by applying a correcting model, wherein the correcting model scales the initial SNP by a factor inversely proportional to the signal intensity of the initial SNP; determining a similarity measure between the enhanced SNP for said image with one or more previously calculated enhanced SNPs for one or more different images; and classifying the image in a group of one or more images with similar or identical SNPs based on the determined similarity measure.
    Type: Application
    Filed: February 15, 2010
    Publication date: April 12, 2012
    Inventors: Li Chang-Tsun, Richard Leary