Patents by Inventor Li Qun Ding

Li Qun Ding has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11651587
    Abstract: Various embodiments include a method for product quality inspection on a group of products. The method may include: getting for each product in the group of products: image, value for each known fabrication parameter affecting quality of the group of products, and quality evaluation result; training a neural network. A layer of the neural network comprises at least one first neuron and at least one second neuron; each first neuron represents a known fabrication parameter affecting quality of the group of products and each second neuron represents an unknown fabrication parameter affecting quality of the group of products; and the images of the group of products are input to the neural network, the quality evaluation results are output of the neural network, and the value of each first neuron is set to the value for the known fabrication parameter the first neuron representing.
    Type: Grant
    Filed: December 27, 2019
    Date of Patent: May 16, 2023
    Assignee: SIEMENS AKTIENGESELLSCHAFT
    Inventors: Chang Wei Loh, Jing Wen Zhu, Wei Yu Chen, Yue Yu, Cong Chao Li, Li Qun Ding
  • Publication number: 20230058944
    Abstract: Various embodiments include a method for product quality inspection on a group of products. The method may include: getting for each product in the group of products: image, value for each known fabrication parameter affecting quality of the group of products, and quality evaluation result; training a neural network. A layer of the neural network comprises at least one first neuron and at least one second neuron; each first neuron represents a known fabrication parameter affecting quality of the group of products and each second neuron represents an unknown fabrication parameter affecting quality of the group of products; and the images of the group of products are input to the neural network, the quality evaluation results are output of the neural network, and the value of each first neuron is set to the value for the known fabrication parameter the first neuron representing.
    Type: Application
    Filed: December 27, 2019
    Publication date: February 23, 2023
    Applicant: Siemens Aktiengesellschaft
    Inventors: Chang Wei Loh, Jing Wen Zhu, Wei Yu Chen, Yue Yu, Cong Chao Li, Li Qun Ding