Patents by Inventor Li-Qun SUN

Li-Qun SUN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of determining device type and device properties and system of performing the same
    Patent number: 9632428
    Abstract: A method of determining a device type and device properties includes receiving an input file including information related to a device, and identifying at least one layer set within the input file. The method further includes identifying at least one feature present in layer set. The method further includes analyzing a relationship between the at least one feature formed by the first layer and at least one feature formed by the second layer to determine at least one layer set relationship. The method further includes comparing the layer set relationship with at least one template layer set relationship. The method further includes determining the device type of the device based on the comparison between the layer set relationship and the template layer set relationship. The method further includes determining the device properties of the device based on the layer set relationship, the device type or the at least one feature.
    Type: Grant
    Filed: January 28, 2015
    Date of Patent: April 25, 2017
    Assignee: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD.
    Inventors: Ya-Min Zhang, Mu-Jen Huang, Ming Feng, Peng-Sheng Chen, Li-Qun Sun
  • METHOD OF DETERMINING DEVICE TYPE AND DEVICE PROPERTIES AND SYSTEM OF PERFORMING THE SAME
    Publication number: 20150294040
    Abstract: A method of determining a device type and device properties includes receiving an input file including information related to a device, and identifying at least one layer set within the input file. The method further includes identifying at least one feature present in layer set. The method further includes analyzing a relationship between the at least one feature formed by the first layer and at least one feature formed by the second layer to determine at least one layer set relationship. The method further includes comparing the layer set relationship with at least one template layer set relationship. The method further includes determining the device type of the device based on the comparison between the layer set relationship and the template layer set relationship. The method further includes determining the device properties of the device based on the layer set relationship, the device type or the at least one feature.
    Type: Application
    Filed: January 28, 2015
    Publication date: October 15, 2015
    Inventors: Ya-Min ZHANG, Mu-Jen HUANG, Ming FENG, Peng-Sheng CHEN, Li-Qun SUN