Patents by Inventor Li-Sen Chen

Li-Sen Chen has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6209403
    Abstract: Disclosed in an apparatus for measuring positively-sensed force of an electrical connector, comprising: a base plate; at least one L-shaped pads, the two L-shaped pads being each affixed to the base plate at an upper end thereof in such an arrangement that ends thereof oppose each other; an elastically deformable sheet provided between the two L-shaped pads, the elastically deformable sheet being affixed to the base plate and formed with a projective measuring region at end thereof; and at least one strain gauge inertly affixed to the elastically deformable sheet, the strain gauge beingconnected to a signal transmitting device that outputs strain value of the strain gauge to a signal amplifying device for display purpose in response to deformation of the elastically deformable sheet.
    Type: Grant
    Filed: December 1, 1998
    Date of Patent: April 3, 2001
    Assignee: Industrial Technology Research Institute
    Inventors: Li-Sen Chen, Hung-Ju Yen, Yen-Jang Liao, Wei-Tai Jao
  • Patent number: 6176117
    Abstract: A calibration instrument for micro-positively-sensed force, including: a platform support stand having a base with a vise thereon for clamping an elastically deformable strain measuring device to be calibrated, a micro-distance meter at an upper portion of the platform support, a probe connected to and positioned beneath the micro-distance meter, displacement of the probe in vertical direction being adjustable through the micro-distance meter, the probe having a load cell. The load cell and elastically deformable strain measuring device to be calibrated are each connected to a signal transmitting device which outputs the signals thererof to a signal amplifying device so as to display the signals being measured. And, a method for calibrating a calibration instrument for micro-positively-sensed force that uses the calibration instrument to calibrate a precision measuring device.
    Type: Grant
    Filed: December 1, 1998
    Date of Patent: January 23, 2001
    Assignee: Industrial Technology Research Institute
    Inventors: Li-Sen Chen, Hung-Ju Yen, Chih-Ming Wu, Wei-Tai Jao