Patents by Inventor Li Shi
Li Shi has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20070031505Abstract: The present invention generally relates to stimuli-responsive drug carriers and methods for making. More specifically, the present invention relates to stimuli-responsive lidded particles that respond to a physiological stimulus and dissolve at a target site inside the body thereby releasing therapeutic agents. The present invention further relates to solid, drug-loaded particles that are made from biodegradable polymers. The present invention further relates to methods for fabricating lidded particles and particles for drug delivery.Type: ApplicationFiled: May 5, 2006Publication date: February 8, 2007Inventors: Krishnendu Roy, Li Shi, Luz Glangchai
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Publication number: 20060284791Abstract: An augmented reality system with mobile and interactive functions for multiple users includes two major portions: a computer system for handling augmented reality functions, and a user system for each user. The computer system for handling augmented reality functions has very powerful functionality for processing digital image data and transforming the digital image data into a three-dimensional virtual image for each user system. The user system mainly includes a Head-Mounted Display (HMD), a microphone and a PDA. A user can see the virtual image from the HMD and use the microphone or the PDA for communication with other users.Type: ApplicationFiled: June 21, 2005Publication date: December 21, 2006Applicant: NATIONAL APPLIED RESEARCH LABORATORIES NATIONAL CENTER FOR HIGH-PERFORMANCE COMPUTINGInventors: Kuen-Meau Chen, Lin-Lin Chen, Ming-Jen Wang, Whey-Fone Tsai, Ching-Yu Yang, Wen-Li Shi
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Patent number: 6893884Abstract: A method and apparatus for measuring dopant profile of a semiconductor is disclosed. Initially, the temperature of a tip of a probe and the temperature of a semiconductor sample are ascertained. Then, a voltage at a location on a surface of the semiconductor sample is obtained via the tip of the probe. The dopant concentration at the location of the surface of the semiconductor sample is subsequently determined by combining the obtained voltage and the temperature difference between the probe tip and the semiconductor sample. The above-mentioned steps can be repeated in order to generate a dopant profile of the semiconductor.Type: GrantFiled: March 28, 2002Date of Patent: May 17, 2005Assignee: International Business Machines CorporationInventors: Li Shi, Uttam Shyamalindu Ghoshal
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Patent number: 6866415Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: January 21, 2003Date of Patent: March 15, 2005Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6817761Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: April 21, 2003Date of Patent: November 16, 2004Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20040223976Abstract: The present invention provides vaccines against disease caused by infection with influenza virus, and methods of vaccination. The vaccines comprise peptides derived from the M2 and/or HA proteins of influenza virus conjugated to a carrier protein.Type: ApplicationFiled: March 5, 2004Publication date: November 11, 2004Inventors: Elisabetta Bianchi, Victor M. Garsky, Paolo Ingallinella, Roxana Ionescu, Xiaoping Liang, Antonello Pessi, Craig T. Przysiecki, Li Shi, John W. Shiver
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Patent number: 6724221Abstract: In one form of the invention, circuitry having exclusive-OR and latch functionality includes timing circuitry and logic circuitry. The circuitry includes a memory, with first and second memory nodes, for storing a state and its complement, and first and second timing circuitry portions, each operable to receive at least one timing signal, coupled to the respective memory nodes. The logic circuitry includes first and second logic circuitry portions, each of which is operable to receive at least first and second data signals. Each of the logic circuitry portions is coupled in series with a conditionally conductive path of one of the respective first and second timing circuitry portions.Type: GrantFiled: March 28, 2002Date of Patent: April 20, 2004Assignee: International Business Machines CorporationInventors: Juan-Antonio Carballo, David William Boerstler, Jeffrey L. Burns, Kevin John Nowka, Li Shi
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Publication number: 20040028117Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: April 21, 2003Publication date: February 12, 2004Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6679625Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: December 17, 2001Date of Patent: January 20, 2004Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6652139Abstract: A method of fabricating a scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. The invention also relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: GrantFiled: January 21, 2003Date of Patent: November 25, 2003Assignee: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20030186471Abstract: A method and apparatus for measuring dopant profile of a semiconductor is disclosed. Initially, the temperature of a tip of a probe and the temperature of a semiconductor sample are ascertained. Then, a voltage at a location on a surface of the semiconductor sample is obtained via the tip of the probe. The dopant concentration at the location of the surface of the semiconductor sample is subsequently determined by combining the obtained voltage and the temperature difference between the probe tip and the semiconductor sample. The above-mentioned steps can be repeated in order to generate a dopant profile of the semiconductor.Type: ApplicationFiled: March 28, 2002Publication date: October 2, 2003Applicant: International Business Machines CorporationInventors: Li Shi, Uttam Shyamalindu Ghoshal
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Publication number: 20030184340Abstract: In one form of the invention, circuitry having exclusive-OR and latch functionality includes timing circuitry and logic circuitry. The circuitry includes a memory, with first and second memory nodes, for storing a state and its complement, and first and second timing circuitry portions, each operable to receive at least one timing signal, coupled to the respective memory nodes. The logic circuitry includes first and second logic circuitry portions, each of which is operable to receive at least first and second data signals. Each of the logic circuitry portions is coupled in series with a conditionally conductive path of one of the respective first and second timing circuitry portions.Type: ApplicationFiled: March 28, 2002Publication date: October 2, 2003Applicant: International Business Machines CorporationInventors: Juan-Antonio Carballo, David William Boerstler, Jeffrey L. Burns, Kevin John Nowka, Li Shi
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Publication number: 20030169798Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: January 21, 2003Publication date: September 11, 2003Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20030156623Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: January 21, 2003Publication date: August 21, 2003Inventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Publication number: 20030112844Abstract: A scanning heat flow probe for making quantitative measurements of heat flow through a device under test is provided. In one embodiment the scanning heat flow probe includes an electric current conductor in a cantilever beam connected to a probe tip and coupled to two voltmeter leads. The probe also includes two thermocouple junctions in the cantilever beam electrically isolated from the electric current conductor and the two voltmeter leads. Heat flow is derived quantitatively using only voltage and current measurements. In other forms, the invention relates to the calibration of scanning heat flow probes through a method involving interconnected probes, and relates to the minimization of heat flow measurement uncertainty by probe structure design practices.Type: ApplicationFiled: December 17, 2001Publication date: June 19, 2003Applicant: International Business Machines CorporationInventors: Steven Alan Cordes, David R. DiMilia, James Patrick Doyle, Matthew James Farinelli, Snigdha Ghoshal, Uttam Shyamalindu Ghoshal, Chandler Todd McDowell, Li Shi
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Patent number: 6358744Abstract: Human papillomavirus (HPV) antigen formulations are disclosed which prevent protein aggregation and show prolonged stability as aqueous solutions. These formulations comprise a salt (such as sodium chloride) and a non-ionic surfactant (Polysorbate 80 such as Tween 80®) in physiologically acceptable concentrations.Type: GrantFiled: July 24, 2000Date of Patent: March 19, 2002Assignee: Merck & Co., Inc.Inventors: David B. Volkin, Li Shi, Gautam Sanyal
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Patent number: 6334926Abstract: The present invention is directed to a method for the lamination of metals, and especially copper, to the surfaces of fluoropolymers at temperatures substantially below the sintering temperatures or melting temperatures of the fluoropolymers. More specifically, the invention is directed to a method for surface modification of fluoropolymers by thermal graft copolymerization with concurrent lamination of a metal (e.g. copper) in the presence of a functional monomer. The process can be carried out under atmospheric conditions and in the complete absence of an added polymerization initiator. The so-laminated fluoropolymer-metal interfaces exhibit T-peel strengths of no less than 8 N/cm and delaminate via cohesive failure inside the fluoropolymer.Type: GrantFiled: June 8, 1999Date of Patent: January 1, 2002Assignee: National University of Singapore and Institute of MicroelectronicsInventors: En Tang Kang, Jian-Li Shi, Koon Gee Neoh, Kuang Lee Tan, Cheng Qiang Cui, Thiam Beng Lim
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Publication number: 20010021385Abstract: Human Papillomavirus vaccine formulations which contain virus-like particles (VLPs) can be made more stable and have an enhanced shelf-life, by treating the VLPs to a disassembly and reassembly process. Also provided are formulation buffers to long term stable storage of VLPs.Type: ApplicationFiled: January 30, 2001Publication date: September 13, 2001Inventors: David B. Volkin, Henryk Mach, Li Shi
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Patent number: 6251678Abstract: New human papilloma virus (HPV) vaccine formulations exhibit enhanced long-term stability. Formulation components can include: virus-like particles (VLPs) absorbed onto aluminum, a salt, non-ionic surfactant, and a buffer. Additional formulations also contain a polymeric polyanionic stabilizer and a salt either in the presence or absence buffering agents and nonionic detergent.Type: GrantFiled: February 2, 2000Date of Patent: June 26, 2001Assignee: Merck & Co., Inc.Inventors: David B. Volkin, Li Shi, Henryk Mach
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Patent number: 6245568Abstract: Human Papillomavirus vaccine formulations which contain virus-like particles (VLPs) can be made more stable and have an enhanced shelf-life, by treating the VLPs to a disassembly and reassembly process. Also provided are formulation buffers to long term stable storage of VLPs.Type: GrantFiled: March 13, 2000Date of Patent: June 12, 2001Assignee: Merck & Co., Inc.Inventors: David B. Volkin, Henryk Mach, Li Shi