Patents by Inventor Li-Yang Yang

Li-Yang Yang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • SPLICING BACK PLATE OF LIQUID CRYSTAL DISPLAY MODULE AND SPLICE STRUCTURE THEREOF
    Publication number: 20130149482
    Abstract: The present invention discloses a splicing back plate of a liquid crystal display (LCD) module and a splice structure thereof. The splicing back plate of the LCD module according to the present invention is assembled at least by a first back plate portion and a second back plate portion, wherein at least one splice structure is defined between the first back plate portion and the second back plate portion, and the shapes of two sides of the splice structure are correspondingly engaged with each other. By the splice structure, the present invention can use different type of material to assemble into the splicing back plate of the LCD module, so as to minimize the thickness and maximize the strength except for decreasing the material cost.
    Type: Application
    Filed: November 24, 2011
    Publication date: June 13, 2013
    Applicant: SHENZHEN CHINA STAR OPTOELECTRONICS TECHNOLOGY CO., LTD.
    Inventors: Yicheng Kuo, Yu-Chun Hsiao, Chong Huang, Jiahe Cheng, Chengwen Que, Quan Li, Li-Yang Yang
  • Testing system for semiconductor memory device
    Patent number: 6986082
    Abstract: A testing architecture for a semiconductor memory device is described. The testing architecture comprises a microprocessor, as well as a result sorting and display device. When a start signal is received by the microprocessor, a clock signal is output from the microprocessor to the semiconductor memory device so that a data storing signal is output from the memory device to the microprocessor. When the data storing signal is received by the microprocessor, the data storing signal is tested and compared, and a testing result signal is output. The resorting and display device is used to output the start signal to the microprocessor, receive the result signal, and sort the result signal so as to display whether data stored by the semiconductor memory device is correct.
    Type: Grant
    Filed: June 28, 2001
    Date of Patent: January 10, 2006
    Assignee: Winbond Electronics Corp.
    Inventors: Kun-Ti Hsiao, Hao-Liang Lo, Li-Yang Yang
  • Testing architecture for a semiconductor memory device
    Publication number: 20030005372
    Abstract: A testing architecture for a semiconductor memory device is described. The testing architecture comprises a microprocessor, as well as a result sorting and display device. When a start signal is received by the microprocessor, a clock signal is output from the microprocessor to the semiconductor memory device so that a data storing signal is output from the memory device to the microprocessor. When the data storing signal is received by the microprocessor, the data storing signal is tested and compared, and a testing result signal is output. The resorting and display device is used to output the start signal to the microprocessor, receive the result signal, and sort the result signal so as to display whether data stored by the semiconductor memory device is correct.
    Type: Application
    Filed: June 28, 2001
    Publication date: January 2, 2003
    Inventors: K. T. Hsiao, Hao-Liang Lo, Li-Yang Yang