Abstract: A method of analysing a sample in the form of a droplet provided on a sample-receiving surface includes providing a light source and a detector in a housing, positioning said sample-receiving surface in or on the housing, and focussing an incident beam of light to a focal point in the vicinity of the sample. Light is detected from the sample resulting from an interaction with the sample, the sample-receiving surface, or the atmosphere surrounding the sample. At least one parameter of the detected light is measured, and the sample-receiving surface is translated relative to the housing such that the focal point is at a different region of the sample, the sample-receiving surface, or the atmosphere surrounding the sample. The step of measuring one or more parameters of the detected light is repeated following the translating step.

Abstract: A method of analysing a sample in the form of a droplet provided on a sample-receiving surface includes providing a light source and a detector in a housing, positioning said sample-receiving surface in or on the housing, and focussing an incident beam of light to a focal point in the vicinity of the sample. Light is detected from the sample resulting from an interaction with the sample, the sample-receiving surface, or the atmosphere surrounding the sample. At least one parameter of the detected light is measured, and the sample-receiving surface is translated relative to the housing such that the focal point is at a different region of the sample, the sample-receiving surface, or the atmosphere surrounding the sample. The step of measuring one or more parameters of the detected light is repeated following the translating step.

Abstract: An apparatus for analyzing optical properties of a sample includes a housing to receive a light source and a detector; a sample locus defined relative to the housing and positioned such that when a light source and a detector are in predetermined positions, the sample locus is subject to illumination by the light source and the detector is positioned to receive and detect light from the sample; a cover on the housing, the cover being movable in a hinged manner between an open position and a closed position; and a sample-receiving surface for receiving a free-standing sample in liquid or semi-solid form. When the cover is moved to the closed position it encloses the sample locus, with the sample-receiving surface being tilted away from horizontal during the closing movement and the sample being retained thereon by surface tension or adhesion and brought to the sample locus in an enclosed environment.

Abstract: An apparatus for analyzing optical properties of a sample includes a housing to receive a light source and a detector; a sample locus defined relative to the housing and positioned such that when a light source and a detector are in predetermined positions, the sample locus is subject to illumination by the light source and the detector is positioned to receive and detect light from the sample; a cover on the housing, the cover being movable in a hinged manner between an open position and a closed position; and a sample-receiving surface for receiving a free-standing sample in liquid or semi-solid form. When the cover is moved to the closed position it encloses the sample locus, with the sample-receiving surface being tilted away from the horizontal during the closing movement and the sample being retained thereon by surface tension or adhesion and brought to the sample locus in an enclosed environment.

Abstract: In an apparatus for surface analysis microscopy, a number of analysis device are mounted on an ultra-high vacuum chamber. The devices include a beam source of locally heating a selected region of a specimen and a temperature-detector for monitoring the heating of the selected region, as well as an electron gun and an analyzer for detecting emission from a specimen region subjected to electron bombardment. An ion gun may also be provided. The apparatus enables thermal microscopy of a specimen to be carried out in conjunction with other surface analysis techniques including, inter alia, scanning electron microscopy and Auger electron microscopy, within a single apparatus and during a single experimental operation. A novel configuration of cylindrical mirror analyser facilitates mounting a multiplicity of analysis devices on the chamber in a compact manner for studying a specimen at a single position.

Abstract: A manipulator for handling objects within a sealed environment, such as an ultra-high vacuum chamber, is mounted on a port of the chamber so that an active portion of the manipulator terminating in a set of gripping jaws is located within the chamber, while an operating portion of the manipulator is located externally of the chamber. The gripping jaws are mounted at one extremity of a shaft for rotation through at least 360.degree. irrespective of whether they are in an open or closed configuration. The jaws are opened and closed from the exterior of the chamber by means of a sleeve which is axially slidable on the shaft by means of a drive ring located on the operating portion of the manipulator.