Abstract: An apparatus includes imaging optics having an objective lens configured to focus electromagnetic radiation to an intermediate image plane and one or more optical devices configured to generate an optical beam from the electromagnetic radiation. The apparatus also includes at least one imaging sensor configured to capture an image from the optical beam. The apparatus further includes a beam generator configured to generate and transmit an HEL beam through the imaging optics. In addition, the apparatus includes an intermediate alignment target configured to be moveably positioned at the intermediate image plane. The intermediate alignment target includes a first-wavelength target configured to reflect a first spectral band of the HEL beam to a first of the at least one imaging sensor (the first imaging sensor configured to capture a first-wavelength infrared image of the first spectral band) and transmit remaining spectral portions of the HEL beam towards the objective lens.

Abstract: An apparatus includes imaging optics having an objective lens configured to focus electromagnetic radiation to an intermediate image plane and one or more optical devices configured to generate an optical beam from the electromagnetic radiation. The apparatus also includes at least one imaging sensor configured to capture an image from the optical beam. The apparatus further includes a beam generator configured to generate and transmit an HEL beam through the imaging optics. In addition, the apparatus includes an intermediate alignment target configured to be moveably positioned at the intermediate image plane. The intermediate alignment target includes a first-wavelength target configured to reflect a first spectral band of the HEL beam to a first of the at least one imaging sensor (the first imaging sensor configured to capture a first-wavelength infrared image of the first spectral band) and transmit remaining spectral portions of the HEL beam towards the objective lens.

Abstract: An apparatus includes a substrate and first and second electrical connectors. The apparatus also includes at least one first conductive trace positioned in, on, or over the substrate. The at least one first conductive trace forms an electrical connection between the first and second electrical connectors. The at least one first conductive trace is configured to be damaged by laser energy to break the electrical connection between the first and second electrical connectors. The apparatus further includes an indicator electrically coupled to the at least one first conductive trace. The indicator is configured to generate feedback based on whether the electrical connection between the first and second electrical connectors has been broken.

Abstract: An apparatus includes a substrate and first and second electrical connectors. The apparatus also includes at least one first conductive trace positioned in, on, or over the substrate. The at least one first conductive trace forms an electrical connection between the first and second electrical connectors. The at least one first conductive trace is configured to be damaged by laser energy to break the electrical connection between the first and second electrical connectors. The apparatus further includes an indicator electrically coupled to the at least one first conductive trace. The indicator is configured to generate feedback based on whether the electrical connection between the first and second electrical connectors has been broken.