Abstract: A testing device for a USB I/O board includes USB plugs connected to the USB I/O board, a connector connected to the USB I/O board, an indication module, and a testing module including data output terminals connected to the USB plugs, data reception terminals connected to the connector, and indication terminals connected to the indication module. The testing module sends a testing signal to the USB I/O board via the data output terminals, and receives the testing signal from the USB I/O board via the data reception terminals. The testing module compares the testing signal to a threshold signal stored in the testing module. If the testing signal and the threshold signal are not substantially the same, the testing module generates an alarm signal to drive the indication module via the indication terminal. The indication module indicates the USB I/O board is abnormal.

Abstract: A universal serial bus (USB) component tester for testing a USB component that has a plug and a USB port includes a connector, a USB port, and a first indicator. The connector includes a first power pin, a first data pin connected to the first power pin, a second data pin, and a first ground pin connected to the second data pin and also connected to the first data pin via a first resistor. The USB port includes a power terminal connected to a power supply, a first data terminal, a second data terminal, and a grounded ground terminal, and the first data terminal is connected to the second data terminal via a second resistor. The first indicator includes a first terminal connected to the first data terminal via the second resistor, and a second terminal connected to the second data terminal.

Abstract: A testing apparatus includes a relay and a connector. The relay includes a coil, first and second single-pole double-throw (SPDT) switches. The first and the second SPDT switches include first and second contacts. The connector includes first and second hard disk drive (HDD) indicator pins, and first and second switch pins. The first contact of the first SPDT switch is grounded. The first contact of the second SPDT switch is connected to the power source. The first HDD indicator pin is connected to a power source. The second HDD indicator pin is connected to the second contact of the first SPDT switch and the second contact of the second SPDT switch. The first switch pin is connected to the power source. The second switch pin is grounded via the coil.

Abstract: An endurance testing system is configured to test endurance of a first detecting apparatus. The endurance testing system includes a second detecting apparatus, a movement module, a processor, and a storage module. The movement module includes a first inductive object and a second inductive object. The processor is connected to the first and second detecting apparatuses, and the movement module, for controlling the movement module and counting a first number of times the first detecting apparatus detects the first inductive object, and a second number of times the second detecting apparatus detects the second inductive object. The storage module is connected to the processor, for storing the first and second numbers of times from the processor. The first detecting apparatus fails the testing upon the condition that the first number of times is not equal to the second number of times.

Abstract: A clamping mechanism includes a fixing table forming a bracket, a first clamping apparatus, and a second clamping apparatus. The first clamping apparatus includes a sliding member slidably installed on an upper portion of the bracket, and a movable member coupled to the sliding member. The sliding member forms a protrusion, and a first clamping device is installed on the movable member for cooperating with the protrusion of the sliding member to sandwich an upper portion of a workpiece therebetween. The second clamping apparatus includes a sliding block slidably installed on a lower portion of the bracket, and a positioning post slidably installed on the fixing table. The sliding block forms a protrusion, and a second clamping device is installed on the positioning post for cooperating with the protrusion of the sliding block to sandwich a lower portion of the workpiece therebetween.

Abstract: An exemplary metal detector includes a detecting circuit, a SCM, a converting circuit, and a cymometer. The SCM cooperates with the detecting circuit to generate a current signal with a specific frequency, the converting circuit transforms the current signal received from the SCM to a voltage signal, and the cymometer displays a value of a frequency of the current signal according to the voltage signal. When the detecting circuit detects a metal nearby, the value of the frequency of the current signal displayed on the cymometer changes.

Abstract: A detecting apparatus for checking a detected item of an electrically conductive fastener attached to a workpiece includes a lower checking member for supporting the workpiece, an upper checking member movably set above the lower checking member, an electrical source, a processor, and an indicator. At least one of the two members includes a checking unit, which touches with the fastener and together with the fastener forms a detecting circuit when the upper checking member abuts against the workpiece. The detecting circuit is connected to the electrical source. A closed or open state of the detecting circuit indicates whether the detected item is eligible or ineligible. The processor controls the indicator to show the checking result according to the closed or open state of the detecting circuit. The detecting apparatus can greatly improve the checking efficiency and reliability, and suits mass production.

Abstract: A luminous intensity measuring device includes a photoresistor, a number of voltage-dividing resistors, a plurality of comparators, a micro control unit (MCU), and an indicator. The photoresistor is connected to a current-limiting resistor in series between a direct current (DC) power supply and ground. The voltage-dividing resistors are connected in series, and together are connected parallel to the photoresistor and the current-limiting resistor located between the DC power supply and ground. A non-inverting node between the photoresistor and the current-limiting resistor is connected to the non-inverting input terminals of the comparators. The inverting terminals of the comparators are respectively connected to inverting nodes between every two adjacent voltage-dividing resistors. The output terminals of the comparators are connected to the input terminals of the MCU. The indicator is connected to the output terminals of the MCU. The MCU controls the indicator to indicate luminous intensity.

Abstract: An exemplary apparatus for testing planeness of a workpiece is provided. The apparatus includes a platform for supporting the workpiece thereon, a bracket vertically mounted to the platform, and a testing system mounted to the bracket for testing the workpiece. The testing system includes a testing member, a test dial indicator having a sliding pole, and a fine-tuning member for controlling the movement of the testing member. One end of the testing member is connected to the sliding pole. When testing, the fine-tuning member drives the testing member to move toward the workpiece, until the testing member contacts the workpiece. The sliding pole extends together with the testing member. A value is shown by the test dial indicator that indicates the moving distance of the testing member. A distortion value of the workpiece can be obtained according to the value.

Abstract: A universal serial bus (USB) component tester for testing a USB component that has a plug and a USB port includes a connector, a USB port, and a first indicator. The connector includes a first power pin, a first data pin connected to the first power pin, a second data pin, and a first ground pin connected to the second data pin and also connected to the first data pin via a first resistor. The USB port includes a power terminal connected to a power supply, a first data terminal, a second data terminal, and a grounded ground terminal, and the first data terminal is connected to the second data terminal via a second resistor. The first indicator includes a first terminal connected to the first data terminal via the second resistor, and a second terminal connected to the second data terminal.

Abstract: A testing apparatus includes a relay and a connector. The relay includes a coil, first and second single-pole double-throw (SPDT) switches. The first and the second SPDT switches include first and second contacts. The connector includes first and second hard disk drive (HDD) indicator pins, and first and second switch pins. The first contact of the first SPDT switch is grounded. The first contact of the second SPDT switch is connected to the power source. The first HDD indicator pin is connected to a power source. The second HDD indicator pin is connected to the second contact of the first SPDT switch and the second contact of the second SPDT switch. The first switch pin is connected to the power source. The second switch pin is grounded via the coil.

Abstract: An endurance testing system is configured to test endurance of a first detecting apparatus. The endurance testing system includes a second detecting apparatus, a movement module, a processor, and a storage module. The movement module includes a first inductive object and a second inductive object. The processor is connected to the first and second detecting apparatuses, and the movement module, for controlling the movement module and counting a first number of times the first detecting apparatus detects the first inductive object, and a second number of times the second detecting apparatus detects the second inductive object. The storage module is connected to the processor, for storing the first and second numbers of times from the processor. The first detecting apparatus fails the testing upon the condition that the first number of times is not equal to the second number of times.

Abstract: A wire clamp for protecting a wire in a reciprocating machine includes an upper clamping member and a lower clamping member configured for slidably sandwiching the wire therebetween. The upper clamping member or the lower clamping member is pivotably mounted to the reciprocating machine. When the wire bends to travel during reciprocating movement, the upper and lower clamping members are pivoted with the wire to prevent the wire from being sharply bent which leads to stress concentration. Thus, fatigue of the wire will be reduced and a life span of the wire will be prolonged.

Abstract: A detecting apparatus for checking shape, size and/or position of a hole of a workpiece, includes a platform for supporting the workpiece, a detecting board, which includes a detecting unit, movably set above the platform, an electrical source, a processor, and an indicator. The source, the unit, and the workpiece make up a circuit connected to the processor. When the board is moved to the workpiece, and the unit enters the hole without touching the workpiece the circuit will remain open, and the processor will control the indicator to indicate that the hole is eligible. If the detecting unit touches the workpiece, the circuit closes, and the processor will control the indicator to indicate that the hole is ineligible. An end of the unit that enters the hole is radially deformable. The apparatus improves detecting efficiency and accuracy, and is suitable for use in mass production.

Abstract: A metal detecting apparatus includes a sensor, a current signal outputting circuit, a transforming circuit, and a micro processing unit (MPU). The sensor is configured to sense metal objects in close proximity. The current signal outputting circuit is configured to generate alternative current signals. The alternative current signals are converted to digital voltage signals via the transforming circuit. The MPU is configured to obtain a specific frequency value of the alternative current signals according to the digital voltage signals. When the sensor senses a metal object in close proximity, the specific frequency value obtained by the MPU changes. The MPU is configured to determine if a metal object has been detected by determining if the obtained specific frequency value has changed.

Abstract: A fixing device for fixing a workpiece defining a hole, includes a fixing shaft, a sliding bar, and a sliding block. The fixing shaft is configured to be inserted in the hole of the workpiece and defines a groove therein along an axial direction thereof. The sliding bar is mounted to the fixing shaft and movable in the groove along the axial direction. The sliding block is mounted to the fixing shaft and movable in the groove along a radial direction of the fixing shaft. When the sliding bar moves forward along the axial direction, the sliding block is moved toward the sliding bar along the radial direction. When the sliding bar moves backward along the axial direction, the sliding block is driven to move away from the sliding bar along the axial direction to urge against a wall bounding the hole of the workpiece to fix the workpiece.

Abstract: An exemplary test apparatus for a columniform workpiece includes a base plate, a support plate perpendicularly mounted to a top surface of the base plate, a shaft rotatably mounted to the support plate, a contact member mounted the support plate and perpendicularly slidable relative to the support plate, and a test meter. The shaft is configured for mounting the columniform workpiece at a side of the support plate and making the columniform workpiece perpendicularly rotate relative to the support plate. The contact member includes a first end contacting the end surface of the columniform workpiece. The test meter includes a pole with a distal end contacting a second end opposite to the first end of the contact member, the poles' length resiliently adjusting corresponding to the end surface of the columniform workpiece, and a value of the test meter changing corresponding to changes in the length of the pole.

Abstract: An exemplary metal detector includes a detecting circuit, a SCM, a converting circuit, and a cymometer. The SCM cooperates with the detecting circuit to generate a current signal with a specific frequency, the converting circuit transforms the current signal received from the SCM to a voltage signal, and the cymometer displays a value of a frequency of the current signal according to the voltage signal. When the detecting circuit detects a metal nearby, the value of the frequency of the current signal displayed on the cymometer changes.

Abstract: A testing device for a USB I/O board includes USB plugs connected to the USB I/O board, a connector connected to the USB I/O board, an indication module, and a testing module including data output terminals connected to the USB plugs, data reception terminals connected to the connector, and indication terminals connected to the indication module. The testing module sends a testing signal to the USB I/O board via the data output terminals, and receives the testing signal from the USB I/O board via the data reception terminals. The testing module compares the testing signal to a threshold signal stored in the testing module. If the testing signal and the threshold signal are not substantially the same, the testing module generates an alarm signal to drive the indication module via the indication terminal. The indication module indicates the USB I/O board is abnormal.

Abstract: A luminous intensity measuring device includes a photoresistor, a number of voltage-dividing resistors, a plurality of comparators, a micro control unit (MCU), and an indicator. The photoresistor is connected to a current-limiting resistor in series between a direct current (DC) power supply and ground. The voltage-dividing resistors are connected in series, and together are connected parallel to the photoresistor and the current-limiting resistor located between the DC power supply and ground. A non-inverting node between the photoresistor and the current-limiting resistor is connected to the non-inverting input terminals of the comparators. The inverting terminals of the comparators are respectively connected to inverting nodes between every two adjacent voltage-dividing resistors. The output terminals of the comparators are connected to the input terminals of the MCU. The indicator is connected to the output terminals of the MCU. The MCU controls the indicator to indicate luminous intensity.