Patents by Inventor Liana Ilkova

Liana Ilkova has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Illuminator with phase scrambling particles
    Patent number: 11940633
    Abstract: An illuminator has phase scrambling particles to reduce speckle.
    Type: Grant
    Filed: June 30, 2020
    Date of Patent: March 26, 2024
    Assignee: Intel Corporation
    Inventors: Khaled Ahmed, Liana Ilkova
  • Methods, systems and apparatuses for testing and calibrating fluorescent scanners
    Patent number: 11009462
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Grant
    Filed: August 13, 2019
    Date of Patent: May 18, 2021
    Assignee: Affymetrix, Inc.
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • ILLUMINATOR WITH PHASE SCRAMBLING PARTICLES
    Publication number: 20200333617
    Abstract: An illuminator has phase scrambling particles to reduce speckle.
    Type: Application
    Filed: June 30, 2020
    Publication date: October 22, 2020
    Applicant: INTEL CORPORATION
    Inventors: Khaled Ahmed, Liana Ilkova
  • METHODS, SYSTEMS AND APPARATUSES FOR TESTING AND CALIBRATING FLUORESCENT SCANNERS
    Publication number: 20200041416
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Application
    Filed: August 13, 2019
    Publication date: February 6, 2020
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • Methods, systems and apparatuses for testing and calibrating fluorescent scanners
    Patent number: 10422750
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Grant
    Filed: February 6, 2018
    Date of Patent: September 24, 2019
    Assignee: Affymetrix, Inc.
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • METHODS, SYSTEMS AND APPARATUSES FOR TESTING AND CALIBRATING FLUORESCENT SCANNERS
    Publication number: 20180238802
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Application
    Filed: February 6, 2018
    Publication date: August 23, 2018
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • Methods, systems and apparatuses for testing and calibrating fluorescent scanners
    Patent number: 9933365
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Grant
    Filed: February 21, 2017
    Date of Patent: April 3, 2018
    Assignee: Affymetrix, Inc.
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • Methods, Systems and Apparatuses for Testing and Calibrating Fluorescent Scanners
    Publication number: 20170160199
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Application
    Filed: February 21, 2017
    Publication date: June 8, 2017
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • Methods, systems and apparatuses for testing and calibrating fluorescent scanners
    Patent number: 9599561
    Abstract: Disclosed are calibration apparatuses for fluorescent microscopy instruments and methods of making and using them. Specifically, disclosed are calibration apparatuses with a fluorescent layer, such as photoresist, deposited on a substrate, with an optional layer of a reflective material, such as chrome. Illumination of the fluorescent and/or reflective layers, and detection and analysis of the resulting emissions allows evaluation of the instrument with respect to both reflective and fluorescent channels. Selection of appropriate fluorescent materials for the one or more fluorescent layers allows the evaluation of an instrument with respect to different fluorophores, as would be used with an instrument capable of two color detection.
    Type: Grant
    Filed: October 12, 2012
    Date of Patent: March 21, 2017
    Assignee: Affymetrix, Inc.
    Inventors: Bei-Shen Sywe, Mark Borodkin, Chuan Gao, Liana Ilkova, Devin Nguyen
  • Fluorescent detector with automatic changing filters
    Patent number: 7295316
    Abstract: A fluorometry device and method adapted to determine concentration of spectrally distinguishable species in a biological sample with a plurality of movable optical devices.
    Type: Grant
    Filed: January 14, 2004
    Date of Patent: November 13, 2007
    Assignee: Applera Corporation
    Inventors: Steven J. Boege, Jon A. Hoshizaki, Mark F. Oldham, Liana Ilkova
  • Fluorescent detector with automatic changing filters
    Patent number: 7289217
    Abstract: A fluorometry device and method adapted to determine concentration of spectrally distinguishable species in a biological sample with a plurality of movable optical devices.
    Type: Grant
    Filed: August 30, 2004
    Date of Patent: October 30, 2007
    Assignee: Applera Corporation
    Inventors: Steven J. Boege, Mark F. Oldham, Liana Ilkova
  • Fluorescent detector with automatic changing filters
    Publication number: 20050190366
    Abstract: A fluorometry device and method adapted to determine concentration of spectrally distinguishable species in a biological sample with a plurality of movable optical devices.
    Type: Application
    Filed: August 30, 2004
    Publication date: September 1, 2005
    Applicant: Applera Corporation
    Inventors: Steven Boege, Mark Oldham, Liana Ilkova
  • Fluorescent detector with automatic changing filters
    Publication number: 20050151972
    Abstract: A fluorometry device and method adapted to determine concentration of spectrally distinguishable species in a biological sample with a plurality of movable optical devices.
    Type: Application
    Filed: January 14, 2004
    Publication date: July 14, 2005
    Applicant: Applera Corporation
    Inventors: Steven Boege, Jon Hoshizaki, Mark Oldham, Liana Ilkova