Abstract: A method and an apparatus for processing three-dimensional vision measurement data are provided.

Abstract: A light bulb base includes a cylinder-shaped insulating component, a cylinder-shaped base connector, a metal thimble and a heat-dissipating component. The insulating component has a jack at its first side. The base connector has a circumferential interior bore extending there through. The interior bore accommodates the insulating component at a first side of the base connector. The metal thimble inserts into the jack at its first side via the interior bore. Such that the metal thimble rivets the base connector to the insulating component. The heat-dissipating component has a first side coupled to a second side of the insulating component. The heat-dissipating component includes a first opening at its second side. The heat-dissipating component also includes a cavity chamber disposed inside the first opening.

Abstract: Embodiments of a method include: converting at least one image of a printed mask to a plurality of representative contours, each corresponding to mask patterns in the printed mask; determining whether the printed mask includes a printing defect based on whether the plurality of representative contours violates a set of contour tolerances for the printed mask; in response to at least one of plurality of representative contours violating at least one of the set of contour tolerances: identifying a location where a representative contour violates the at least one of the set of contour tolerances, and generating an instruction to adjust a layout for the printed mask, based on the violating of the at least one of the set of contour tolerances; and in response to none of the plurality of representative contours violating the set of contour tolerances, flagging a layout for the printed mask as compliant.

Abstract: The present disclosure discloses an LED lighting device, which includes a head portion, a heat sink, a mounting portion, a lighting circuit and an optical element. The head portion is configured for mounting the LED lighting device to an outer installation device and electrically connecting the LED lighting device with an outer power source. The lighting circuit includes a circuit board and at least one LED light source arranged on one surface of the circuit board. The lighting circuit is held between the mounting portion and the optical element, and light emitted from the at least one LED light source is output after distributed by the optical element. The heat sink is held between the head portion and the mounting portion.

Abstract: Methods according to the disclosure include: predicting process-sensitive geometries (PSGs) in a proposed IC layout based on violations of a set of processing constraints for the proposed IC layout, the set of processing constraints being calculated with a predictive model based on a training data repository having a plurality of optical rule check (ORC) simulations for different IC layouts; identifying actual PSGs in a circuit manufactured using the proposed IC layout; determining whether the predicted PSGs correspond to the actual PSGs in the manufactured circuit as being correct; in response to the predicting being incorrect: adjusting the predictive model based on the actual PSGs, wherein the adjusting includes submitting additional ORC data to the training data repository; and flagging the proposed IC layout as incorrectly predicted; and in response to the predicting being correct, flagging the proposed IC layout as correctly predicted.

Abstract: Various aspects include vectorization approaches for model-based mask proximity correction (MPC). In some cases, a computer-implemented method includes: assigning a set of vectors to geometry data describing at least one mask for forming an integrated circuit (IC); adjusting a statistical predictive model of the at least one mask based upon the set of vectors and the geometry data; predicting an adjustment to the at least one mask with the statistical predictive model; and adjusting instructions for forming the at least one mask in response to a predicted mask result of the statistical predictive model deviating from a target mask result for the at least one mask.

Abstract: Embodiments of a method include: converting at least one image of a printed mask to a plurality of representative contours, each corresponding to mask patterns in the printed mask; determining whether the printed mask includes a printing defect based on whether the plurality of representative contours violates a set of contour tolerances for the printed mask; in response to at least one of plurality of representative contours violating at least one of the set of contour tolerances: identifying a location where a representative contour violates the at least one of the set of contour tolerances, and generating an instruction to adjust a layout for the printed mask, based on the violating of the at least one of the set of contour tolerances; and in response to none of the plurality of representative contours violating the set of contour tolerances, flagging a layout for the printed mask as compliant.

Abstract: A method and an apparatus for processing three-dimensional vision measurement data are provided.

Abstract: The present disclosure discloses a lighting device, including: a housing, an optical element connected with the housing, a receiving chamber formed by engaging the housing with the optical element, and a light source component and a driving power supply component both located in the receiving chamber. The lighting device further includes a passage located in the receiving chamber, the passage passes through the housing and the optical element, and an interior of the lighting device is communicated with an exterior of the lighting device by the passage.

Abstract: Various aspects include vectorization approaches for model-based mask proximity correction (MPC). In some cases, a computer-implemented method includes: assigning a set of vectors to geometry data describing at least one mask for forming an integrated circuit (IC); adjusting a statistical predictive model of the at least one mask based upon the set of vectors and the geometry data; predicting an adjustment to the at least one mask with the statistical predictive model; and adjusting instructions for forming the at least one mask in response to a predicted mask result of the statistical predictive model deviating from a target mask result for the at least one mask.

Abstract: The present application discloses a method, an apparatus and a terminal for detecting a malware file. One embodiment of the method comprises: obtaining a file to be inspected; determining an entropy vector of the file; and inspecting the entropy vector of the file using a trained inspection model to determine if the file is a malware file, wherein a file type of the file is identical to the file type corresponding to the inspection model. This embodiment extracts the entropy vector of the file and determines if the file is a malware file based on the entropy vector of the file. Therefore, the technical problems existed in the art, such as a low speed, a poor capacity and a low efficiency of detecting and destroying the malware file, are addressed and the efficiency of detecting and destroying the malware file is enhanced.

Abstract: Methods according to the disclosure include: predicting process-sensitive geometries (PSGs) in a proposed IC layout based on violations of a set of processing constraints for the proposed IC layout, the set of processing constraints being calculated with a predictive model based on a training data repository having a plurality of optical rule check (ORC) simulations for different IC layouts; identifying actual PSGs in a circuit manufactured using the proposed IC layout; determining whether the predicted PSGs correspond to the actual PSGs in the manufactured circuit as being correct; in response to the predicting being incorrect: adjusting the predictive model based on the actual PSGs, wherein the adjusting includes submitting additional ORC data to the training data repository; and flagging the proposed IC layout as incorrectly predicted; and in response to the predicting being correct, flagging the proposed IC layout as correctly predicted.

Abstract: A feature point matching method of a planar array of a four-camera group and a measuring method based on the feature point matching method of the planar array of the four-camera group relate to the field of optical electronic measurement. The matching method comprises determining unique matching point groups on four imaging planes corresponding to the same viewed point. For each unique matching point group, three-dimensional space coordinates of the viewed point can be calculated according to image coordinates of the matching point group and parameters of the camera system itself. Under any illumination conditions, as long as the acquired image is clear enough, for any viewed object imaged on an image of a planar array of a four-camera group and having certain image features, using completely identical matching method and measuring method can realize three-dimensional measurement of the viewed object.

Abstract: The present disclosure discloses an LED lighting device, which includes a head portion, a heat sink, a mounting portion, a lighting circuit and an optical element. The head portion is configured for mounting the LED lighting device to an outer installation device and electrically connecting the LED lighting device with an outer power source. The lighting circuit includes a circuit board and at least one LED light source arranged on one surface of the circuit board. The lighting circuit is held between the mounting portion and the optical element, and light emitted from the at least one LED light source is output after distributed by the optical element. The heat sink is held between the head portion and the mounting portion.

Abstract: Disclosed are a file scanning method and apparatus. The method includes: obtaining a quantity of hard links of a to-be-scanned file used as a scanning target; if the quantity of hard links of the to-be-scanned file is greater than 1, when the to-be-scanned file is used as the scanning target for the first time, invoking a scanning engine to scan the to-be-scanned file to obtain a scanning result, and storing a file identifier uniquely identifying the to-be-scanned file and the scanning result to a storage unit, and when the to-be-scanned file is used as the scanning target again, querying for and obtaining the scanning result of the to-be-scanned file from the storage unit according to the file identifier.

Abstract: A wind power generation system and a control method thereof are provided herein. The wind power generation system includes a doubly-fed generator, a generator-side converter, a grid-side converter and an auxiliary converter. The doubly fed generator includes a stator winding and a rotor winding. The stator winding is coupled to a grid. The generator-side converter is coupled to the rotor winding. The grid-side converter is coupled between the generator-side converter and the grid. The auxiliary converter includes a first side and a second side. The first side is coupled to the stator winding. The second side is coupled between the generator-side converter and the grid-side converter. The generator-side converter, the grid-side converter and the auxiliary converter use the same DC bus.

Abstract: An LED light source device includes an LED light source dot at least emitting light of one color and a light emission portion emitting light of different colors. The light emission portion includes a light emission portion for a main illumination and for emitting a white light and a light emission portion for a scene illumination and for emitting a colored light. The light emission portion for the main illumination emits the white light and the light emission portion for the scene illumination emits the colored light simultaneously. The LED light source device is a bulb lamp, a candle lamp or other lamps of which a front side and a lateral side both emits light.

Abstract: A feature point matching method of a planar array of a four-camera group and a measuring method based on the feature point matching method of the planar array of the four-camera group relate to the field of optical electronic measurement. The matching method comprises determining unique matching point groups on four imaging planes corresponding to the same viewed point. For each unique matching point group, three-dimensional space coordinates of the viewed point can be calculated according to image coordinates of the matching point group and parameters of the camera system itself. Under any illumination conditions, as long as the acquired image is clear enough, for any viewed object imaged on an image of a planar array of a four-camera group and having certain image features, using completely identical matching method and measuring method can realize three-dimensional measurement of the viewed object.

Abstract: Disclosed are exemplary embodiments of systems and methods for limiting DC voltage. In an exemplary embodiment, a DC voltage limiting circuit generally includes a current supply portion configured to receive a voltage input signal and provide a voltage output signal. A protective portion of the circuit is configured to limit or halt, at least temporarily, operation of the current supply portion based on a magnitude of the voltage input signal. A voltage level control portion is configured to limit the voltage output signal to a predetermined voltage level. In some embodiments, the DC voltage limiting circuit is provided in a climate control system controller.

Abstract: One or more systems and techniques for modeling are provided. An original device model, such as a SPICE model, is used as a basis for fabricating a semiconductor arrangement, such as an integrated circuit arrangement, upon a semiconductor wafer. Fabrication process variations cause measured e-parameters and measured size e-parameters of the semiconductor arrangement to vary from original design parameters of the original device model. Accordingly, a partial set of e-parameters and a partial set of size e-parameters are measured from the semiconductor arrangement, and are expanded into a full set of e-parameters and a full set of size e-parameters using e-parameter derivation and size-centric derivation. The original device model is retargeted using the full set of e-parameters and the full set of size e-parameters to create a new device model that more accurately represents the real-world or fabricated semiconductor arrangement.