Patents by Inventor Liangliang Guo

Liangliang Guo has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Publication number: 20150001632
    Abstract: MEMS devices and methods for forming the same are provided. A first metal interconnect structure is formed on a first semiconductor substrate to connect to a CMOS control circuit in the first semiconductor substrate. A bonding layer having a cavity is formed on the first metal interconnect structure, and then bonded with a second semiconductor substrate. A conductive plug passes through a first region of the second semiconductor substrate, through the bonding layer, and on the first metal interconnect structure. A second metal interconnect structure includes a first end formed on the first region of the second semiconductor substrate, and a second end connected to the conductive plug. Through-holes are disposed through a second region of the second semiconductor substrate and through a top portion of the bonded layer that is on the cavity to leave a movable electrode to form the MEMS device.
    Type: Application
    Filed: June 25, 2014
    Publication date: January 1, 2015
    Inventors: XUANJIE LIU, HONGMEI XIE, LIANGLIANG GUO
  • Patent number: 8679937
    Abstract: A method for fabricating a capacitor includes providing a substrate having a first surface and a second surface, and forming a plurality of openings in the substrate, the openings are separated from each other by a shape of the substrate, each opening having sidewalls and a bottom. The method further includes submitting the substrate including the openings to an oxidation process to form an oxide layer covering the sidewalls and the bottom of the openings, and a portion of a surface of the substrate, wherein a shape of the substrate disposed between a pair of two adjacent openings is completely oxidized to form an insulation layer between the pair of two adjacent openings; and depositing a conductive material layer over the oxide layer in the openings such that the conductive material layer is electrically continuous and such that the pair of adjacent openings form a capacitor.
    Type: Grant
    Filed: September 16, 2011
    Date of Patent: March 25, 2014
    Assignee: Semiconductor Manufacturing International (Shanghai) Corporation
    Inventors: Yefang Zhu, Liangliang Guo, Herb Huang
  • Publication number: 20120168902
    Abstract: A method for fabricating a capacitor includes providing a substrate having a first surface and a second surface, and forming a plurality of openings in the substrate, the openings are separated from each other by a shape of the substrate, each opening having sidewalls and a bottom. The method further includes submitting the substrate including the openings to an oxidation process to form an oxide layer covering the sidewalls and the bottom of the openings, and a portion of a surface of the substrate, wherein a shape of the substrate disposed between a pair of two adjacent openings is completely oxidized to form an insulation layer between the pair of two adjacent openings; and depositing a conductive material layer over the oxide layer in the openings such that the conductive material layer is electrically continuous and such that the pair of adjacent openings form a capacitor.
    Type: Application
    Filed: September 16, 2011
    Publication date: July 5, 2012
    Applicant: Semiconductor Manufacturing International (Shanghai) Corporation
    Inventors: Yefang Zhu, Liangliang Guo, Herb Huang