Patents by Inventor Lianrui Zang

Lianrui Zang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • System and method for generating and measuring noise parameters
    Patent number: 7177772
    Abstract: A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.
    Type: Grant
    Filed: May 25, 2004
    Date of Patent: February 13, 2007
    Assignee: Texas Instruments Incorporated
    Inventors: Henry P. Largey, Dale A. Heaton, Lianrui Zang
  • System and method for generating and measuring noise parameters
    Publication number: 20050267716
    Abstract: A method for measuring noise parameters includes generating a noise signal at a noise source. The noise signal includes a first input signal at a first frequency and a second input signal at a second frequency. The first input signal and the second input signal are modulated onto a carrier to generate a modulated signal. The modulated signal is attenuated to a desired power level and applied to a device under test to obtain a noise measurement.
    Type: Application
    Filed: May 25, 2004
    Publication date: December 1, 2005
    Inventors: Henry Largey, Dale Heaton, Lianrui Zang