Abstract: A waveguide structure is provided. A silicon substrate layer, a silicon waveguide layer, a first silicon dioxide layer, a silicide waveguide layer, and a second silicon dioxide layer are stacked in sequence, the silicon waveguide layer is a conical waveguide layer, the silicon waveguide layer and the silicide waveguide layer are coupled by using an evanescent wave, the silicide waveguide layer includes multiple first waveguide blocks and multiple second waveguide blocks, a material of the first waveguide blocks is the same as a material of the silicide waveguide layer, and a refractive index of a material of the second waveguide blocks is lower than a refractive index of the material of the first waveguide blocks. By using the waveguide structure, a waveguide flare size can be increased, so as to match a mode size of a fiber core of an optical fiber.

Abstract: Embodiments of the present invention disclose a method, an apparatus, and a system for detecting an optical network. The method comprises: receiving, by a management device, a reflection peak power reported by a testing device, where the reflection peak power is a reflection peak power of an optical splitter that is obtained by the testing device according to a reflected optical signal, the reflected optical signal is an optical signal obtained by reflecting, by the optical splitter, a testing optical signal that is sent by the testing device and is transmitted to the optical splitter through an optical cable, and the optical splitter reflects the testing optical signal by using a reflective film disposed on an end surface of one optical output port. a detector does not need to carry a testing device to a site, to perform detection, efficiency of detecting performance of an optical network is improved.

Abstract: Embodiments of the present invention disclose a method, an apparatus, and a system for detecting an optical network. The method comprises: receiving, by a management device, a reflection peak power reported by a testing device, where the reflection peak power is a reflection peak power of an optical splitter that is obtained by the testing device according to a reflected optical signal, the reflected optical signal is an optical signal obtained by reflecting, by the optical splitter, a testing optical signal that is sent by the testing device and is transmitted to the optical splitter through an optical cable, and the optical splitter reflects the testing optical signal by using a reflective film disposed on an end surface of one optical output port. a detector does not need to carry a testing device to a site, to perform detection, efficiency of detecting performance of an optical network is improved.

Abstract: The present invention provides an optical splitter and a system, including: an optical divider, a ribbon fiber, and tributary fibers, where the optical divider is configured to divide an input optical signal into at least two optical signals for output; one end of the ribbon fiber is connected to the optical divider, and the other end of the ribbon fiber is connected to the tributary fibers, where a grating array is disposed on the ribbon fiber; and the grating array includes at least two Bragg gratings, different Bragg gratings correspond to different tributary lines of the optical divider, and the number of Bragg gratings included in the grating array is the same as the number of optical signals output by the optical divider; which solves a problem that additional connection loss is increased because an existing splitter needs to be connected to each link fiber by using an optical connector.

Abstract: A hybrid optoelectronic module used in duplexer or triplexer includes a transmitter chip for emitting a first signal beam at wavelength ?1, a single fiber for transmitting the first signal beam at wavelength ?1 and a second signal beam at wavelength ?2, a WDM filter for transmitting the first signal beam and reflecting the second signal beam, and a detective chip for receiving the second signal beam at wavelength ?2. The transmitter chip, the WDM filter and the detective chip are assembled together in an optical bench, the arrangement of these passive and active components is removed from TO-CAN structure so that packaging assembly requirements may be greatly reduced and turn to be convenient in manufacturing process.