Patents by Inventor Libor Kovarik
Libor Kovarik has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11857950Abstract: A material and a method of making hydrothermally stable (catalytic) materials on the basis of theta-alumina support that is thermally and hydrothermally stable up to 1,150 C with metal, mixed metal-, metal-oxide nanoparticles dispersed upon it. Such materials did not lose significant amounts of their catalytic activity at temperature ranges for industrially relevant applications (including hydrocarbon oxidation, nitric oxide reduction, carbon monoxide oxidation) even after hydrothermal aging up to 1,150° C.Type: GrantFiled: November 17, 2021Date of Patent: January 2, 2024Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Konstantin Khivantsev, Libor Kovarik, Janos Szanyi, Yong Wang, Ja-Hun Kwak, Nicholas R. Jaegers
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Publication number: 20220152585Abstract: A material and a method of making hydrothermally stable (catalytic) materials on the basis of theta-alumina support that is thermally and hydrothermally stable up to 1,150 C with metal, mixed metal-, metal-oxide nanoparticles dispersed upon it. Such materials did not lose significant amounts of their catalytic activity at temperature ranges for industrially relevant applications (including hydrocarbon oxidation, nitric oxide reduction, carbon monoxide oxidation) even after hydrothermal aging up to 1,150° C.Type: ApplicationFiled: November 17, 2021Publication date: May 19, 2022Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Konstantin Khivantsev, Libor Kovarik, Janos Szanyi, Yong Wang, Ja-Hun Kwak, Nicholas R. Jaegers
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Patent number: 11071966Abstract: Disclosed are passive NOx adsorbers and methods for synthesizing the same. Small-pore zeolitic materials with practical loadings of transition metals atomically dispersed in the micropores are described herein. Also demonstrated are simple and scalable synthesis routes to high loadings of atomically dispersed transition metals in the micropores of a small-pore zeolite.Type: GrantFiled: August 21, 2019Date of Patent: July 27, 2021Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Konstantin Khivantsev, Janos Szanyi, Nicholas R. Jaegers, Libor Kovarik, Feng Gao, Yong Wang
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Patent number: 10598609Abstract: Liquid sample imaging devices and processes are disclosed for high resolution TEM imaging and multimodal analyses of liquid sample materials in situ under high vacuum that are compatible with standard type TEM chip membranes and TEM sample holders allowing TEM liquid sample imaging to be performed wherever a TEM instrument is accessible and at a substantially reduced cost compared to prior art systems and approaches.Type: GrantFiled: April 10, 2017Date of Patent: March 24, 2020Assignee: Battelle Memorial InstituteInventors: Xiao-Ying Yu, Libor Kovarik, Bruce W. Arey
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Patent number: 10580614Abstract: Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.Type: GrantFiled: April 7, 2017Date of Patent: March 3, 2020Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Publication number: 20200061595Abstract: Disclosed are passive NOx adsorbers and methods for synthesizing the same. Small-pore zeolitic materials with practical loadings of transition metals atomically dispersed in the micropores are described herein. Also demonstrated are simple and scalable synthesis routes to high loadings of atomically dispersed transition metals in the micropores of a small-pore zeolite.Type: ApplicationFiled: August 21, 2019Publication date: February 27, 2020Applicants: BATTELLE MEMORIAL INSTITUTE, WASHINGTON STATE UNIVERSITYInventors: Konstantin Khivantsev, Janos Szanyi, Nicholas R. Jaegers, Libor Kovarik, Feng Gao, Yong Wang
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Patent number: 10541109Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.Type: GrantFiled: July 26, 2017Date of Patent: January 21, 2020Assignee: BATTELLE MEMORIAL INSTITUTEInventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
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Patent number: 10431419Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: GrantFiled: July 7, 2017Date of Patent: October 1, 2019Assignee: Battelle Memorial InstituteInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10256072Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyzes thereof.Type: GrantFiled: August 1, 2017Date of Patent: April 9, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10224175Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: March 5, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
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Publication number: 20190043690Abstract: Disclosed are methods for optimized sub-sampling in an electron microscope. With regard at least to utilization of electron dose budgets, of time for acquisition of measurements, and of computing/processing capabilities, very high efficiencies can be achieved by informing and/or adapting subsequent sub-sampling measurements according to one or more earlier-acquired sparse datasets and/or according to analyses thereof.Type: ApplicationFiled: August 1, 2017Publication date: February 7, 2019Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Andrew J. Stevens, Libor Kovarik, Andrey V. Liyu, Nigel D. Browning
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Patent number: 10170274Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: October 5, 2016Date of Patent: January 1, 2019Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Patent number: 10109453Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: GrantFiled: March 18, 2016Date of Patent: October 23, 2018Assignee: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu
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Publication number: 20180033591Abstract: Disclosed are methods for sensing conditions of an electron microscope system and/or a specimen analyzed thereby. Also disclosed are sensor systems and electron microscope systems able to sense system conditions, and/or conditions of the specimen being analyzed by such systems. In one embodiment, a sparse dataset can be acquired from a random sub-sampling of the specimen by an electron beam probe of the electron microscope system. Instrument parameters, specimen characteristics, or both can be estimated from the sparse dataset.Type: ApplicationFiled: July 26, 2017Publication date: February 1, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Bryan A. Stanfill, Sarah M. Reehl, Margaret C. Johnson, Lisa M. Bramer, Nigel D. Browning, Andrew J. Stevens, Libor Kovarik
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Publication number: 20180025887Abstract: Sparse sampling approaches and probe systems for analytical instruments are disclosed providing for effective sub-sampling of a specimen and inpainting to reconstruct representations of actual information. The sub-sampling involves serial acquisition of contiguous measured values lying at positions along a scan path extending in a line toward a first direction and having random perturbations in a second direction. The perturbations are limited within a predetermined distance from the line. Inpainting techniques are utilized among the measured values to reconstruct a representation of actual information regarding the specimen.Type: ApplicationFiled: July 7, 2017Publication date: January 25, 2018Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Libor Kovarik, Andrew J. Stevens, Andrey V. Liyu, Nigel D. Browning
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Publication number: 20170316916Abstract: Mask-modulated spectra are incident to a sensor and are summed during a frame time. After the frame time, a compressed spectrum is read out based on the sum and decompressed to obtain spectra for some or all specimen locations. The mask-modulated spectrum that are summed are associated with different modulations produced by a common mask.Type: ApplicationFiled: April 7, 2017Publication date: November 2, 2017Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Publication number: 20170213692Abstract: Liquid sample imaging devices and processes are disclosed for high resolution TEM imaging and multimodal analyses of liquid sample materials in situ under high vacuum that are compatible with standard type TEM chip membranes and TEM sample holders allowing TEM liquid sample imaging to be performed wherever a TEM instrument is accessible and at a substantially reduced cost compared to prior art systems and approaches.Type: ApplicationFiled: April 10, 2017Publication date: July 27, 2017Applicant: BATTELLE MEMORIAL INSTITUTEInventors: Xiao-Ying Yu, Libor Kovarik, Bruce W. Arey
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Publication number: 20170025247Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: October 5, 2016Publication date: January 26, 2017Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning
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Publication number: 20160276129Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: March 18, 2016Publication date: September 22, 2016Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu, Xin Yuan, Lawrence Carin
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Publication number: 20160276050Abstract: Transmission microscopy imaging systems include a mask and/or other modulator situated to encode image beams, e.g., by deflecting the image beam with respect to the mask and/or sensor. The beam is modulated/masked either before or after transmission through a sample to induce a spatially and/or temporally encoded signal by modifying any of the beam/image components including the phase/coherence, intensity, or position of the beam at the sensor. For example, a mask can be placed/translated through the beam so that several masked beams are received by a sensor during a single sensor integration time. Images associated with multiple mask displacements are then used to reconstruct a video sequence using a compressive sensing method. Another example of masked modulation involves a mechanism for phase-retrieval, whereby the beam is modulated by a set of different masks in the image plane and each masked image is recorded in the diffraction plane.Type: ApplicationFiled: March 18, 2016Publication date: September 22, 2016Applicant: Battelle Memorial InstituteInventors: Andrew J. Stevens, Libor Kovarik, Nigel D. Browning, Andrey V. Liyu