Abstract: A manufacturing management system and method. The system includes a manufacturing execution system and a plurality of manufacturing sites coupled to the manufacturing execution system. The manufacturing execution system comprises management data to support the manufacturing sites. Each manufacturing site comprises a corresponding site attribute. At least one of the manufacturing sites receives a lot, queries the management data for the lot from the manufacturing execution system according to lot identification and the site attribute of the manufacturing site receiving the lot, and processes the lot accordingly.

Abstract: A manufacturing management system and method. The system includes a manufacturing execution system and a plurality of manufacturing sites coupled to the manufacturing execution system. The manufacturing execution system comprises management data to support the manufacturing sites. Each manufacturing site comprises a corresponding site attribute. At least one of the manufacturing sites receives a lot, queries the management data for the lot from the manufacturing execution system according to lot identification and the site attribute of the manufacturing site receiving the lot, and processes the lot accordingly.

Abstract: A testing system for check-in control in wafer testing. The testing system comprises a testing tool, an optical character recognition (OCR) device, and a controller. The testing tool performs a testing process of an article. The OCR device reads optical characters disposed on the article. The controller, connected to the testing tool and the OCR device, automatically initiates a check-in process for the article according to the read optical characters.

Abstract: A new solution in 300 mm Chip Probing (CP) Manufacturing Execution System (MES) design based on a SiView infrastructure. It models actual behavior making it possible to specify exact test program and equipment configuration. The test program, product file, and probe card are modeled into the MES infrastructure so that extra systems and tables requiring costly maintenance can be eliminated. With the required tester configuration built into the product class and tester capability status built into the test equipment's properties, real-time lot-equipment dispatching can occur according to the configuration. A modified version can be supported by I-EDA and PCMS.