Abstract: A TEE-based method to establish trusted and secure channel between the user and public cloud environment, an apparatus, a computer device, and a computer-readable storage medium are provided. After a TEE is started, a trusted measurement mechanism of the TEE is called to perform security measurement on an operation environment and an operation content of a computing node operated in the TEE, and a measurement result is sent to a trusted verification module. Relevant verification information is acquired from a remote verification server of the TEE, and the trusted verification module is controlled to verify the measurement result according to the relevant verification information. When it is confirmed that the operation environment of the computing node is credible and the operation content of the computing node is secure, a communication channel is established between the user and the computing node.

Abstract: A system for concurrently testing multiple semiconductor components includes multiple testers, each including a processor and a memory configured to store and execute control signals for completing testing of one of the semiconductor components, a tester side docking board, and a tester communication port. A handler has multiple test sites, each of which is configured to receive one of the semiconductor components, a handler side docking board, and a handler communication port. A controller is located externally from the testers and the handler and is in communication with each of the testers and the handler through the tester and handler communication ports. Communication between each of the testers and the handler occurs through the controller, and each of the testers is connected, via the tester side docking board, to a corresponding one of the semiconductor components through the handler side docking board.

Abstract: A system for concurrently testing multiple semiconductor components includes multiple testers, each including a processor and a memory configured to store and execute control signals for completing testing of one of the semiconductor components, a tester side docking board, and a tester communication port. A handler has multiple test sites, each of which is configured to receive one of the semiconductor components, a handler side docking board, and a handler communication port. A controller is located externally from the testers and the handler and is in communication with each of the testers and the handler through the tester and handler communication ports. Communication between each of the testers and the handler occurs through the controller, and each of the testers is connected, via the tester side docking board, to a corresponding one of the semiconductor components through the handler side docking board.