Abstract: An arithmetic logic unit (ALU) includes a front end latch stage coupled to a Gray code (GC) generator to latch GC outputs, a signal latch stage coupled to latch outputs of the front end latch stage, a GC to binary stage coupled to generate a binary representation of the GC outputs, an adder stage including first inputs coupled to receive outputs of the GC to binary stage, a pre-latch stage coupled to latch outputs of the adder stage, and a feedback latch stage coupled to latch outputs of the pre-latch stage in response to a feedback latch enable signal. The feedback latch enable signal is one of a correlated multiple sampling (CMS) feedback enable signal and a non-CMS feedback enable signal. The ALU is configured to perform CMS calculations in response to the CMS feedback enable signal and perform non-CMS calculations in response to the non-CMS feedback enable signal.

Abstract: An imaging device includes a pixel array with 2×2 pixel circuits arranged in rows and columns. Each 2×2 pixel circuit includes 4 photodiodes. Bitlines are coupled to the 2×2 pixel circuits and a color filter array is disposed over photodiodes of the pixel array. The color filter array includes color filters having a first color, color filters having a second color, color filters having a third color. The photodiodes of each 2×2 pixel circuits are covered by one of the color filters. Photodiodes covered by color filters having the first color and photodiodes covered by color filters having the second color are configured to provide non-phase detection (non-PD) information. Photodiodes covered by color filters having the third color are configured to provide phase detection (PD) information. Half of the 2×2 pixel circuits have the photodiodes covered by color filters having the third color.

Abstract: A readout circuit includes a comparator having a first input coupled to receive a ramp signal from a ramp generator and a second input coupled to receive an analog image data signal from one of a plurality of bitlines. The comparator is configured to generate a comparator output in response to a comparison of the ramp signal and the analog image data signal. A sampling circuit has a first input coupled to receive a sampling control signal and a second input coupled to receive the comparator output. The sampling circuit is configured to generate a sampling output. A counter has a first input coupled to receive a counter control signal and a second input coupled to receive one of the comparator output and a signal from the sampling circuit. The readout circuit is configured to perform correlated multiple sampling (CMS) calculations or non-CMS calculations in response to the sampling output.

Abstract: An arithmetic logic unit (ALU) includes a front end latch stage coupled to a Gray code (GC) generator to latch GC outputs, a signal latch stage coupled to latch outputs of the front end latch stage, a GC to binary stage coupled to generate a binary representation of the GC outputs, an adder stage including first inputs coupled to receive outputs of the GC to binary stage, a pre-latch stage coupled to latch outputs of the adder stage, and a feedback latch stage coupled to latch outputs of the pre-latch stage in response to a feedback latch enable signal. The feedback latch enable signal is one of a correlated multiple sampling (CMS) feedback enable signal and a non-CMS feedback enable signal. The ALU is configured to perform CMS calculations in response to the CMS feedback enable signal and perform non-CMS calculations in response to the non-CMS feedback enable signal.

Abstract: A readout circuit includes a comparator having a first input coupled to receive a ramp signal from a ramp generator and a second input coupled to receive an analog image data signal from one of a plurality of bitlines. The comparator is configured to generate a comparator output in response to a comparison of the ramp signal and the analog image data signal. A sampling circuit has a first input coupled to receive a sampling control signal and a second input coupled to receive the comparator output. The sampling circuit is configured to generate a sampling output. A counter has a first input coupled to receive a counter control signal and a second input coupled to receive one of the comparator output and a signal from the sampling circuit. The readout circuit is configured to perform correlated multiple sampling (CMS) calculations or non-CMS calculations in response to the sampling output.

Abstract: An imaging device includes a pixel array with 2×2 pixel circuits arranged in rows and columns. Each 2×2 pixel circuit includes 4 photodiodes. Bitlines are coupled to the 2×2 pixel circuits and a color filter array is disposed over photodiodes of the pixel array. The color filter array includes color filters having a first color, color filters having a second color, color filters having a third color. The photodiodes of each 2×2 pixel circuits are covered by one of the color filters. Photodiodes covered by color filters having the first color and photodiodes covered by color filters having the second color are configured to provide non-phase detection (non-PD) information. Photodiodes covered by color filters having the third color are configured to provide phase detection (PD) information. Half of the 2×2 pixel circuits have the photodiodes covered by color filters having the third color.

Abstract: An imaging device includes a pixel array of pixel circuits arranged in rows and columns. Bitlines are coupled to the pixel circuits. Clamp circuits are coupled to the bitlines. Each of the clamp circuits includes a clamp short transistor to a power line and a respective one of the bitlines. The clamp short transistor is configured to be switched in response to a clamp short enable signal. A first diode drop device is coupled to the power line. A clamp idle transistor is coupled to the first diode drop device such that the first diode drop device and the clamp idle transistor are coupled between the power line and the respective one of the bitlines. The clamp idle transistor is configured to be switched in response to a clamp idle enable signal.

Abstract: An arithmetic logic unit (ALU) includes a front end latch stage coupled to a signal latch stage coupled to a Gray code (GC) to binary stage. First inputs of an adder stage are coupled to receive outputs of the GC to binary stage. Outputs of the adder stage are generated in response to the first inputs and second inputs of the adder stage. A pre-latch stage is coupled to latch outputs of the adder stage. A feedback latch stage is coupled to latch outputs of the pre-latch stage. The second inputs of the adder stage are coupled to receive outputs of the feedback latch stage. The feedback stage includes first conversion gain feedback latches configured to latch outputs of the pre-latch stage having a first conversion gain and second conversion gain feedback latches configured to latch outputs of the pre-latch stage having a second conversion gain.

Abstract: An arithmetic logic unit (ALU) includes a front end latch stage coupled to a signal latch stage coupled to a Gray code (GC) to binary stage. First inputs of an adder stage are coupled to receive outputs of the GC to binary stage. Outputs of the adder stage are generated in response to the first inputs and second inputs of the adder stage. A pre-latch stage is coupled to latch outputs of the adder stage. A feedback latch stage is coupled to latch outputs of the pre-latch stage. The second inputs of the adder stage are coupled to receive outputs of the feedback latch stage. The feedback stage includes first conversion gain feedback latches configured to latch outputs of the pre-latch stage having a first conversion gain and second conversion gain feedback latches configured to latch outputs of the pre-latch stage having a second conversion gain.

Abstract: An imaging device includes a pixel array of pixel circuits arranged in rows and columns. Bitlines are coupled to the pixel circuits. Clamp circuits are coupled to the bitlines. Each of the clamp circuits includes a clamp short transistor to a power line and a respective one of the bitlines. The clamp short transistor is configured to be switched in response to a clamp short enable signal. A first diode drop device is coupled to the power line. A clamp idle transistor is coupled to the first diode drop device such that the first diode drop device and the clamp idle transistor are coupled between the power line and the respective one of the bitlines. The clamp idle transistor is configured to be switched in response to a clamp idle enable signal.

Abstract: An imaging device includes a pixel array of 1×3 pixel circuits that include 3 photodiodes in a column. Bitlines are coupled to the 1×3 pixel circuits. The bitlines are divided into groupings of 3 bitlines per column of the 1×3 pixel circuits. Each column of the 1×3 pixel circuits includes a plurality of first banks coupled to a first bitline, a plurality of second banks coupled to a second bitline, and a plurality of third banks coupled to a third bitline of a respective grouping of the 3 bitlines. The 1×3 pixel circuits are arranged into groupings of 3 1×3 pixel circuits per nine cell pixel structures that form a plurality of 3×3 pixel structures of the pixel array.

Abstract: An arithmetic logic unit (ALU) includes a front end latch stage coupled to latch Gray code (GC) outputs of a GC generator in response to a comparator output. A signal latch stage is coupled to latch outputs of the front end latch stage. A GC to binary stage is coupled to generate a binary representation of the GC outputs latched in the signal latch stage. First inputs of an adder stage are coupled to receive outputs of the GC to binary stage. Outputs of the adder stage are generated in response to the first inputs and second inputs of the adder stage. A pre-latch stage is coupled to latch outputs of the adder stage. A feedback latch stage is coupled to latch outputs of the pre-latch stage. The second inputs of the adder stage are coupled to receive outputs of the feedback latch stage.

Abstract: A ramp generator providing ramp signal with high resolution fine gain includes a current mirror having a first and second paths to conduct a capacitor current and an integrator current responsive to the capacitor current. First and second switched capacitor circuits are coupled to the first path. A fractional divider circuit is coupled to receive a clock signal to generate in response to an adjustable fractional divider ratio K a switched capacitor control signal that oscillates between first and second states to control the first and second switched capacitor circuits. The first and second switched capacitor circuits are coupled to be alternatingly charged by the capacitor current and discharged in response to each the switched capacitor control signal. An integrator coupled is to the second path to generate the ramp signal in response to the integrator current.

Abstract: A readout circuit for use in an image sensor includes a plurality of comparators. Each one of the plurality of comparators is coupled to receive a ramp signal and a respective analog image data signal from a respective one of a plurality of column bit lines to generate a respective comparator output. Each one of a plurality of arithmetic logic units (ALUs) is coupled to receive phase-aligned Gray code (GC) outputs generated by a GC generator. Each one of the plurality of ALUs is further coupled to a respective one of the plurality of comparators to receive the respective comparator output. Each one of the plurality of ALUs is coupled to latch the phase-aligned GC outputs in response to the respective comparator output to generate a respective digital image data signal.

Abstract: A clock control circuit of an ADC includes a plurality of fractional divider circuits, each including a programmable integer divider coupled to receive an enable skew signal, a clock signal, and an output integer signal to divide down the clock signal by a factor responsive to the output integer signal to generate a fractional divider signal. A delta-sigma modulator is coupled to receive a fractional modulus signal, an input integer signal, and the fractional divider signal to generate the output integer signal, which is a varying signal each cycle and having a long term average DC value substantially equal to a fractional divider ratio K. An extended gain control circuit is coupled to receive the fractional divider signal from each of the fractional divider circuits to generate a plurality of ramp clock signals with adjustable frequencies to adjust a gain setting of a ramp generator of the ADC.

Abstract: An arithmetic logic unit (ALU) includes a front end latch stage coupled to latch Gray code (GC) outputs of a GC generator in response to a comparator output. A signal latch stage is coupled to latch outputs of the front end latch stage. A GC to binary stage is coupled to generate a binary representation of the GC outputs latched in the signal latch stage. First inputs of an adder stage are coupled to receive outputs of the GC to binary stage. Outputs of the adder stage are generated in response to the first inputs and second inputs of the adder stage. A pre-latch stage is coupled to latch outputs of the adder stage. A feedback latch stage is coupled to latch outputs of the pre-latch stage. The second inputs of the adder stage are coupled to receive outputs of the feedback latch stage.

Abstract: A ramp generator providing ramp signal with high resolution fine gain includes a current mirror having a first and second paths to conduct a capacitor current and an integrator current responsive to the capacitor current. First and second switched capacitor circuits are coupled to the first path. A fractional divider circuit is coupled to receive a clock signal to generate in response to an adjustable fractional divider ratio K a switched capacitor control signal that oscillates between first and second states to control the first and second switched capacitor circuits. The first and second switched capacitor circuits are coupled to be alternatingly charged by the capacitor current and discharged in response to each the switched capacitor control signal. An integrator coupled is to the second path to generate the ramp signal in response to the integrator current.

Abstract: A readout circuit for use in an image sensor includes a plurality of comparators. Each one of the plurality of comparators is coupled to receive a ramp signal and a respective analog image data signal from a respective one of a plurality of column bit lines to generate a respective comparator output. Each one of a plurality of arithmetic logic units (ALUs) is coupled to receive phase-aligned Gray code (GC) outputs generated by a GC generator. Each one of the plurality of ALUs is further coupled to a respective one of the plurality of comparators to receive the respective comparator output. Each one of the plurality of ALUs is coupled to latch the phase-aligned GC outputs in response to the respective comparator output to generate a respective digital image data signal.