Abstract: The invention relates generally to recombinant human sialidases and recombinant sialidase fusion proteins, wherein the sialidase optionally contains one or more mutations compared to wild-type human sialidase, e.g., a substitution, deletion, or addition of at least one amino acid. The invention also provides antibody conjugates including a sialidase and an antibody or a portion thereof. The invention further relates to methods of using the sialidase fusion proteins or antibody conjugates for treating cancer.

Abstract: An electrically programmable fuse controller, a method of controlling a drive voltage of an integrated circuit (IC) and an IC incorporating the controller or the method. In one embodiment, the controller includes a VID eFuse controller configured to receive and write a voltage identifier to an associated eFuse and thereafter allow the voltage identifier to be read from the eFuse and employed to set a drive voltage of an integrated circuit associated with the VID eFuse controller.

Abstract: A fast active DCAP cell which has a short turn-on time, achieves a high capacitance density, and which minimizes leakage overhead during its normal operation mode is disclosed. The DCAP cell has a pair of PMOS transistors that have their drains connected to a gate of a PMOS transistor and their sources connected to the VDD rail. The drain and source of the PMOS transistor are connected to the VSS rail. Likewise, the DCAP cell has a pair of NMOS transistors that have their drains connected to a gate of an PMOS transistor and their sources connected to the VSS rail. The drain and source of the PMOS transistor are connected to the VDD rail. None of the gates of the transistors is connected to the VDD or VSS rail. This protects the gate oxide from being damaged by ESD surge currents.

Abstract: A fast active DCAP cell which has a short turn-on time, achieves a high capacitance density, and which minimizes leakage overhead during its normal operation mode is disclosed. The DCAP cell has a pair of PMOS transistors that have their drains connected to a gate of a PMOS transistor and their sources connected to the VDD rail. The drain and source of the PMOS transistor are connected to the VSS rail. Likewise, the DCAP cell has a pair of NMOS transistors that have their drains connected to a gate of an PMOS transistor and their sources connected to the VSS rail. The drain and source of the PMOS transistor are connected to the VDD rail. None of the gates of the transistors is connected to the VDD or VSS rail. This protects the gate oxide from being damaged by ESD surge currents.

Abstract: The present invention provides a method for simulating noise in an integrated circuit system. According to the method disclosed herein, the present invention includes determining a plurality of peak current values, where each peak current value of the plurality of peak current values corresponds to a different voltage value. The present invention also includes graphing the plurality of peak current values as a function of voltage, and deriving a model based on the graph of the plurality of peak current values. Noise in the integrated circuit system can then be simulated based on the model.

Abstract: A method for estimating decoupling capacitance during an ASIC design flow is disclosed. The method includes precharacterizing a set of power grid structures to model their respective noise behaviors, and storing the respective noise behaviors as noise factors in a table. During the ASIC design flow for a current design that includes at least one of the precharacterized power grid structures, the corresponding noise factor from the table is used to calculate decoupling capacitance for the current design.

Abstract: A method for estimating decoupling capacitance during an ASIC design flow is disclosed. The method includes precharacterizing a set of power grid structures to model their respective noise behaviors, and storing the respective noise behaviors as noise factors in a table. During the ASIC design flow for a current design that includes at least one of the precharacterized power grid structures, the corresponding noise factor from the table is used to calculate decoupling capacitance for the current design.