Patents by Inventor Lik Son Wong

Lik Son Wong has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method for screening semiconductor devices for contact coplanarity
    Publication number: 20040087157
    Abstract: A method for determining contact coplanarity of packaged semiconductor devices having a plurality of contacts. The method includes the steps of measuring the relative positions of the contacts on a subject semiconductor device; calculating from the measurements seating planes 64 formed by tilting the device to one or more of its corners and/or sides such that each said plane comprises contacts at or adjacent to the corners of the device; using the measured relative contact positions and the calculated seating planes to determine the highest deviation from contact coplanarity for the semiconductor device.
    Type: Application
    Filed: October 17, 2003
    Publication date: May 6, 2004
    Inventor: Lik Son Wong
  • Method for screening semiconductor devices for contact coplanarity
    Patent number: 6713311
    Abstract: A method for determining contact coplanarity of packaged semiconductor devices having a plurality of contacts. The method includes the steps of measuring the relative positions of the contacts on a subject semiconductor device; calculating from the measurements seating planes 64 formed by tilting the device to one or more of its corners and/or sides such that each said plane comprises contacts at or adjacent to the corners of the device; using the measured relative contact positions and the calculated seating planes to determine the highest deviation from contact coplanarity for the semiconductor device.
    Type: Grant
    Filed: September 25, 2001
    Date of Patent: March 30, 2004
    Assignee: Texas Instruments Incorporated
    Inventor: Lik Son Wong
  • Method for screening semiconductor devices for contact coplanarity
    Publication number: 20030059965
    Abstract: A method for determining contact coplanarity of packaged semiconductor devices having a plurality of contacts. The method includes the steps of measuring the relative positions of the contacts on a subject semiconductor device; calculating from the measurements seating planes 64 formed by tilting the device to one or more of its corners and/or sides such that each said plane comprises contacts at or adjacent to the corners of the device; using the measured relative contact positions and the calculated seating planes to determine the highest deviation from contact coplanarity for the semiconductor device.
    Type: Application
    Filed: September 25, 2001
    Publication date: March 27, 2003
    Inventor: Lik Son Wong