Abstract: Method and apparatus for testing the operation of an integrated circuit (IC) while maintaining the supply input to the IC constantly active during the test. A logic indication signal that provides a first logic level indicating the active state of the supply input and a second logic level indicating the inactive state of the supply input, is generated. The inactive state of the supply input is simulated by processing the first logic level and by generating a third logic level that is essentially similar, or identical, to the second logic level. The third logic level is applied to one or more signal-carrying contacts within the IC and these, or other, signal-carrying contacts within the IC are accessed and their corresponding signal values responsive to the applied third logic level are read. One or more read signal values are compared with the one or more values expected for such readings.

Abstract: An apparatus for and method of reducing the power consumed by a microprocessor core are disclosed. The apparatus and method reduce power by not loading operands into the core's data-path when they are already there. The apparatus has a core circuit for implementing a microprocessor core, the core circuit including at least one data bus, a plurality of operand storage circuits, at least one operating circuit, and a control circuit. The data buses are configured to transmit a plurality of operands. The operand storage circuits are connected to the data buses, are configured to receive a plurality of load commands and in accordance therewith to load the operands, and are configured to output the operands. The operating circuits are connected to the operand storage circuits and are configured to receive the operands and in accordance therewith to generate a result signal.