Patents by Inventor Limor MARTIN

Limor MARTIN has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Method of defect detection and system thereof
    Patent number: 10460434
    Abstract: There are provided system and method of detecting defects on a specimen, the method comprising: capturing a first image from a first die and obtaining one or more second images; receiving: i) a first set of predefined first descriptors each representing a type of DOI, and ii) a second set of predefined second descriptors each representing a type of noise; generating at least one difference image based on difference between pixel values of the first image and pixel values derived from the second images; generating at least one third image, comprising: computing a value for each given pixel of at least part of the at least one difference image based on the first and second sets of predefined descriptors, and surrounding pixels centered around the given pixel; and determining presence of defect candidates based on the at least one third image and a predefined threshold.
    Type: Grant
    Filed: August 22, 2017
    Date of Patent: October 29, 2019
    Assignee: Applied Materials Israel Ltd.
    Inventors: Limor Martin, Elad Cohen, Eyal Neistein, Moshe Amzaleg
  • METHOD OF DEFECT DETECTION AND SYSTEM THEREOF
    Publication number: 20190066291
    Abstract: There are provided system and method of detecting defects on a specimen, the method comprising: capturing a first image from a first die and obtaining one or more second images; receiving: i) a first set of predefined first descriptors each representing a type of DOI, and ii) a second set of predefined second descriptors each representing a type of noise; generating at least one difference image based on difference between pixel values of the first image and pixel values derived from the second images; generating at least one third image, comprising: computing a value for each given pixel of at least part of the at least one difference image based on the first and second sets of predefined descriptors, and surrounding pixels centered around the given pixel; and determining presence of defect candidates based on the at least one third image and a predefined threshold.
    Type: Application
    Filed: August 22, 2017
    Publication date: February 28, 2019
    Inventors: Limor MARTIN, Elad COHEN, Eyal NEISTEIN, Moshe AMZALEG